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pro vyhledávání: '"Tongda Lu"'
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 9, Iss 1, Pp 975-985 (2018)
Atomic force microscopy (AFM) images normally exhibit various artifacts. As a result, image flattening is required prior to image analysis. To obtain optimized flattening results, foreground features are generally manually excluded using rectangular
Externí odkaz:
https://doaj.org/article/6c4d2f16804e48efbc25396733a556df
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 8, Iss 1, Pp 2572-2582 (2017)
Interfacial nanobubbles (NBs) and nanodroplets (NDs) have been attracting increasing attention due to their potential for numerous applications. As a result, the automated segmentation and morphological characterization of NBs and NDs in atomic force
Externí odkaz:
https://doaj.org/article/6dab7428492d4ffaaeb11d888c215097
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 9, Iss 1, Pp 975-985 (2018)
Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology
Atomic force microscopy (AFM) images normally exhibit various artifacts. As a result, image flattening is required prior to image analysis. To obtain optimized flattening results, foreground features are generally manually excluded using rectangular
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 8, Iss 1, Pp 2572-2582 (2017)
Beilstein Journal of Nanotechnology
Beilstein Journal of Nanotechnology
Interfacial nanobubbles (NBs) and nanodroplets (NDs) have been attracting increasing attention due to their potential for numerous applications. As a result, the automated segmentation and morphological characterization of NBs and NDs in atomic force
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