Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Ton C. Pinili"'
Autor:
Ivan T. Gil Costa, Allen M. Menor, Alvin B. Denoyo, Ton C. Pinili, Rod J. Delos Santos, Darwin J. De Lazo
Publikováno v:
2018 IEEE 38th International Electronics Manufacturing Technology Conference (IEMT).
In response to the need in the semiconductor industry to have a higher moisture sensitivity level (MSL) satisfying the no delamination criteria in all interfaces for automotive devices with a reasonable cost are the main objectives in this study. To
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4a23bde5f9c452fbca95c4408cc991ce
https://doi.org/10.1109/iemt.2018.8511792
https://doi.org/10.1109/iemt.2018.8511792
