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pro vyhledávání: '"Tomoyuki Oishi"'
Autor:
Takayuki Katsunuma, Tomoyuki Oishi, Akihiro Tsuji, Masahiro Tabata, Ogawa Shuhei, Toru Hisamatsu, Masanobu Honda, Yoshihide Kihara
Publikováno v:
ECS Transactions. 75:3-10
In recent years, the progression of very large scale integration of semiconductor devices and miniaturization require extension of ultra-high selectivity process and CD control technique exhibiting atomic-layer-level control. We introduce herein a st