Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Tomokazu Shimakura"'
Autor:
Tomokazu Shimakura, Yoshio Takahashi, Akira Sugawara, Noboru Moriya, Hiroyuki Nishihara, Masakazu Sugaya, Tetsuya Akashi
Publikováno v:
Ultramicroscopy. 197:105-111
A side-entry specimen holder capable of applying a 0.5-tesla in-plane magnetic-induction field for in-situ transmission electron microscopy was developed. Three miniaturized electromagnets with 300 × 300-µm pole area and 180-µm pole gap are stacke
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e89f6212bfecd1be843ba42348987b12
https://doi.org/10.1016/j.ultramic.2018.11.012
https://doi.org/10.1016/j.ultramic.2018.11.012
Autor:
Yoshio Takahashi, Ruriko Tsuneta, Tomokazu Shimakura, Toshiaki Tanigaki, Akira Sugawara, Tetsuya Akashi, Daisuke Shindo
Publikováno v:
Nano Letters. 15:1309-1314
Electron holographic vector field electron tomography visualized three-dimensional (3D) magnetic vortices in stacked ferromagnetic discs in a nanoscale pillar. A special holder with two sample rotation axes, both without missing wedges, was used to r
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e641938d75ae807bae6d2e3b325b523c
https://doi.org/10.1021/nl504473a
https://doi.org/10.1021/nl504473a
Publikováno v:
SICE Journal of Control, Measurement, and System Integration. 3:223-228
The magnetic field of a recording head is measured by projection electron-beam tomography with a resolution of about ten nanometers, and the magnetic field closer to the sample surface than the mea...
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4cf64bad8d85c2207e2c4c9e353ead2d
https://doi.org/10.9746/jcmsi.3.223
https://doi.org/10.9746/jcmsi.3.223
Publikováno v:
Microelectronic Engineering. 85:1811-1814
We developed a mirror electron microscope (MEM) for the highly sensitive inspection of defects on the magnetic storage disks of commercial hard disk drives (HDDs). Magnetic fields recorded on a magnetic disk do not affect the MEM images for inspectio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::372dd9a07de6633a42307e3088e961d7
https://doi.org/10.1016/j.mee.2008.05.018
https://doi.org/10.1016/j.mee.2008.05.018
Publikováno v:
Journal of Magnetism and Magnetic Materials. 287:333-338
We measured the main pole field using electron beam tomography to analyze the GHz response of a single-pole-type (SPT) write head. The response of the head to a current was measured up to 1.3 GHz using a head without a recording medium. The magnetic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e94cd6c53042fbb1650b5b30ee661f9
https://doi.org/10.1016/j.jmmm.2004.10.054
https://doi.org/10.1016/j.jmmm.2004.10.054
Publikováno v:
Journal of the Japan Society for Precision Engineering. 70:746-749
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ea4ddb7cdd0f8b588bd22682464ca4a0
https://doi.org/10.2493/jjspe.70.746
https://doi.org/10.2493/jjspe.70.746
Publikováno v:
Journal of the Magnetics Society of Japan. 27:245-248
We analyzed magnetic field distributions of two kinds of write heads, using a modified high-resolution electron beam tomography technique which employs a patterned electron beam. The heads differ in their saturated magnetic flux density of upper pole
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6dcd43d03c6b22f4b17209411a946b18
https://doi.org/10.3379/jmsjmag.27.245
https://doi.org/10.3379/jmsjmag.27.245
Autor:
Nobuyuki Osakabe, Tetsuya Akashi, Takeshi Kawasaki, Toshiaki Tanigaki, Yoshio Takahashi, Hiroyuki Shinada, Tomokazu Shimakura
Publikováno v:
Microscopy and Microanalysis. 21:1865-1866
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ee42f17a2dc6a3eca44c2947ac34c86c
https://doi.org/10.1017/s1431927615010107
https://doi.org/10.1017/s1431927615010107
Autor:
Tetsuya Akashi, Nobuyuki Osakabe, Tadao Furutsu, Hiroyuki Shinada, Tomokazu Shimakura, Maximilian Haider, Keigo Kasuya, Heiko Müller, Takeshi Kawasaki, Toshiaki Tanigaki, Akira Tonomura, Yoshio Takahashi
Publikováno v:
Microscopy and Microanalysis. 21:1597-1598
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::36d33f5d009c79a502f306b432318eb3
https://doi.org/10.1017/s1431927615008764
https://doi.org/10.1017/s1431927615008764
Publikováno v:
SPIE Proceedings.
We examined the potential of using a mirror-electron-microscope (MEM), which has higher sensitivity than optical inspection tools and faster throughput than scanning electron microscopes (SEMs), as a master template inspection tool. We observed line/
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::de0a94efc121e0ff6fb6ee5bbe06d4df
https://doi.org/10.1117/12.864090
https://doi.org/10.1117/12.864090