Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Tomokazu Hirota"'
Autor:
Noriaki Toyoda, Hiroshi Yakushiji, Isao Yamada, Tomokazu Hirota, Toshinori Ono, Hiroyuki Matsumoto, Tatsuya Hinoue
Publikováno v:
IEEE Transactions on Magnetics. 46:1599-1602
Fabrication of planarized discrete track media (DTM) by using gas cluster ion beams (GCIB) was demonstrated. Line-and-space patterns were fabricated using nanoimprint lithography and ion beam etching. These patterns were refilled by TiCr films, and t
Autor:
Keisuke Nagato, Noriaki Toyoda, Tomokazu Hirota, Yasuo Sakane, Hiroshi Tani, Tetsuya Hamaguchi, Isao Yamada, Masayuki Nakao
Publikováno v:
IEEE Transactions on Magnetics. 45:3503-3506
The planarization of the bit-patterned surface using gas cluster ion beams (GCIBs) was studied. By applying the features of gas cluster ions, such as low-energy irradiation and surface smoothing effects, it is possible to carry out effective smoothin
Autor:
Yasuhito Shimada, Toshio Tanaka, Yuhei Nishimura, Michiko Ariyoshi, Beibei Zhang, Tomokazu Hirota, Junya Kuroyanagi
Publikováno v:
Translational research : the journal of laboratory and clinical medicine. 170
Immune deficiency or suppression in host animals is an essential precondition for the success of cancer cell xenotransplantation because the host immune system has a tendency to reject implanted cells. However, in such animals, the typical tumor micr
Autor:
Noriaki Toyoda, Hiroki Naito, Hiroshi Tani, Hiroaki Hoshino, Tetsuya Hamaguchi, Keisuke Nagato, Masayuki Nakao, Yasuo Sakane, Tomokazu Hirota, Isao Yamada
Publikováno v:
IEEE Transactions on Magnetics. 46:2504-2506
We studied Ar gas cluster ion beam (GCIB) planarization effect on patterned surfaces refilled with Cr, Ta and SiO2. The patterns of 20 nm in depth were fabricated on Si substrate by using electron beam lithography and CHF3 -reactive-ion-etching. The
Autor:
Motohiro Tanaka, Kousuke Moritani, Kozo Mochiji, Noriaki Toyoda, Isao Yamada, Norio Inui, Tomokazu Hirota
Publikováno v:
Rapid communications in mass spectrometry : RCM. 24(10)
A size-selected argon (Ar) gas-cluster ion beam (GCIB) was applied to the secondary ion mass spectrometry (SIMS) of a 1,4-didodecylbenzene (DDB) thin film. The samples were also analyzed by SIMS using an atomic Ar+ ion projectile and X-ray photoelect
Publikováno v:
Japanese Journal of Applied Physics. 49:06GH13
Planarization of nano-structured surface has become important for various devices such as the bit patterned media or discrete track media for next generation storage devices. In this study, gas cluster ion beam (GCIB) assisted deposition was used to