Zobrazeno 1 - 10
of 29
pro vyhledávání: '"Tommi J. Karkkainen"'
Publikováno v:
IEEE Access, Vol 10, Pp 91018-91026 (2022)
Shared energy resources and energy communities are being widely studied and pilots are being implemented in various locations around the world. However, laypeople may find the concepts regarding energy and electricity in general difficult to grasp, a
Externí odkaz:
https://doaj.org/article/7dbe72bc716e4eee84660257afa19e2b
Autor:
Jonny M. Ingman, Joni P. A. Jormanainen, Samu K. Jarvinen, Natalia I. Kanko, Joonas A. R. Leppanen, Aleksi M. Vulli, Tommi J. Karkkainen, Juuso Rautio, Janne Jappinen, Pertti Silventoinen
Publikováno v:
IEEE Access, Vol 9, Pp 133795-133808 (2021)
In this article, a non-destructive method is presented, using 2D X-ray imaging, to investigate corrosion defects in thick film resistors stressed by two different corrosion experiments, a single gas experiment and a flowers of sulphur experiment. In
Externí odkaz:
https://doaj.org/article/a3a08501e08d4d599eedcd3a1ea2d727
Autor:
Saku Levikari, Tommi J. Karkkainen, Caroline Andersson, Juha Tamminen, Mikko Nykyri, Pertti Silventoinen
Publikováno v:
IEEE Access, Vol 8, Pp 226337-226351 (2020)
The energy transition and electrification across many industries place increasingly more weight on the reliability of power electronics. A significant fraction of breakdowns in electronic devices result from capacitor failures. Multilayer ceramic cap
Externí odkaz:
https://doaj.org/article/3a5757c8abff46acab4ef9ebc9ea62fb
Autor:
Natalia I. Kanko, Samu K. Jarvinen, Tommi J. Karkkainen, Joni Jormanainen, Pertti Silventoinen, Jonny Ingman, Aleksi Vulli, Joonas A. R. Leppanen, Juuso Rautio, Janne Jappinen
Publikováno v:
IEEE Access, Vol 9, Pp 133795-133808 (2021)
In this article, a non-destructive method is presented, using 2D X-ray imaging, to investigate corrosion defects in thick film resistors stressed by two different corrosion experiments, a single gas experiment and a flowers of sulphur experiment. In
Autor:
Tommi J. Karkkainen, Mikko Nykyri, Saku Levikari, Pertti Silventoinen, Caroline Andersson, Juha Tamminen
Publikováno v:
IEEE Access, Vol 8, Pp 226337-226351 (2020)
The energy transition and electrification across many industries place increasingly more weight on the reliability of power electronics. A significant fraction of breakdowns in electronic devices result from capacitor failures. Multilayer ceramic cap
Publikováno v:
IECON
In the recent years, multilevel inverter topologies have gained a lot of attention for their ability to produce improved power quality. This paper addresses the operation of a nine-level single-phase inverter called Packed E-Cell Converter. The effec
Autor:
Kari Kerkela, Mikko Kuisma, Mikko Nykyri, Tommi J. Karkkainen, Jesse Myrberg, Jouko Puustinen, Jukka Hallikas, Tero Junkkari
Publikováno v:
INDIN
Industrial automation systems have collected vast amounts of data for years. Data analytics and machine learning can be used to reveal different phenomena and anomalies, which may be otherwise impossible to see. However, the opportunities offered by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::05061fdc46643750a7c309d361bebd90
https://lutpub.lut.fi/handle/10024/160643
https://lutpub.lut.fi/handle/10024/160643
Publikováno v:
IEEE Transactions on Industrial Electronics. 65:570-577
Multilayer ceramic capacitors are prone to mechanical defects and damage because of the fragility of the ceramic dielectric. Because these faults are often not recognized by visual or electrical inspection, a nondestructive fast way of detecting thes
Autor:
Samuli Raisanen, Janne Hannonen, Pertti Silventoinen, Juha-Pekka Strom, Jari Honkanen, Tommi J. Karkkainen
Publikováno v:
IEEE Transactions on Industry Applications. 52:3224-3233
One of the most significant reliability issues in switching-mode power supplies is electrolytic capacitor degradation caused by aging. This paper proposes an output voltage transient analysis method to detect capacitor wear-out at the output stage of
Multilayer Ceramic Capacitors (MLCC) are the most widely used capacitor type in the electronics industry. However, the brittle ceramic dielectric makes MLCCs prone to mechanical damage. Manufacturing defects or damage during board assembly may cause
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7ae3a8c7dbdc8a719942b9c338577248
http://lutpub.lut.fi/handle/10024/158760
http://lutpub.lut.fi/handle/10024/158760