Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Tomasz Rerek"'
Autor:
Mariusz Winiecki, Magdalena Stepczyńska, Krzysztof Moraczewski, Lukasz Skowronski, Marek Trzcinski, Tomasz Rerek, Rafał Malinowski
Publikováno v:
Materials, Vol 17, Iss 5, p 1065 (2024)
In this study, the effect of low-temperature oxygen plasma treatment with various powers of a titanium alloy surface on the structural and morphological properties of a substrate and the deposition of a tannic acid coating was investigated. The surfa
Externí odkaz:
https://doaj.org/article/37ed8819fbcc46de99751d1bd5aa71fa
Autor:
Magdalena Barwiolek, Dominika Jankowska, Anna Kaczmarek-Kędziera, Slawomir Wojtulewski, Lukasz Skowroński, Tomasz Rerek, Paweł Popielarski, Tadeusz M. Muziol
Publikováno v:
Molecules, Vol 27, Iss 21, p 7396 (2022)
Two macrocyclic Schiff bases derived from o-phenylenediamine and 2-hydroxy-5-methylisophthalaldehyde L1 or 2-hydroxy-5-tert-butyl-1,3-benzenedicarboxaldehyde L2, respectively, were obtained and characterized by X-ray crystallography and spectroscopy
Externí odkaz:
https://doaj.org/article/4e979149c5d94feb81701f3fac84631a
Autor:
Tomasz Rerek, Beata Derkowska-Zielinska, Marek Trzcinski, Robert Szczesny, Mieczyslaw K. Naparty, Lukasz Skowronski
Publikováno v:
Materials, Vol 14, Iss 23, p 7292 (2021)
Copper layers with thicknesses of 12, 25, and 35 nm were thermally evaporated on silicon substrates (Si(100)) with two different deposition rates 0.5 and 5.0 Å/s. The microstructure of produced coatings was studied using atomic force microscopy (AFM
Externí odkaz:
https://doaj.org/article/a366bf0ecef140bdbd52ea900a176c80
Autor:
Aleksandra Scigala, Edward Szłyk, Tomasz Rerek, Marek Wiśniewski, Lukasz Skowronski, Marek Trzcinski, Robert Szczesny
Publikováno v:
Materials, Vol 14, Iss 3, p 603 (2021)
Copper nitride nanowire arrays were synthesized by an ammonolysis reaction of copper oxide precursors grown on copper surfaces in an ammonia solution. The starting Cu films were deposited on a silicon substrate using two different methods: thermal ev
Externí odkaz:
https://doaj.org/article/af8dffc6267f4389836a7c73c6b1a72c
Publikováno v:
Thin Solid Films. 670:86-92
Microstructural and opto-electronic properties of thin films strongly depend on the deposition conditions (e.g. temperature, deposition rate). The 30 nm tin (Sn) layers were prepared using the physical vapor deposition technique. The tin layers were
Autor:
Paulina Dzienny, Robert Szczęsny, Tomasz Rerek, Marek Trzciński, Łukasz Skowroński, Arkadiusz Antończak
Publikováno v:
Applied Surface Science. 591:153147
Autor:
Marek Trzcinski, Robert Szczesny, Lukasz Skowronski, Tomasz Rerek, Marek Wiśniewski, Aleksandra Scigala, Edward Szłyk
Publikováno v:
Materials
Materials, Vol 14, Iss 603, p 603 (2021)
Materials; Volume 14; Issue 3; Pages: 603
Materials, Vol 14, Iss 603, p 603 (2021)
Materials; Volume 14; Issue 3; Pages: 603
Copper nitride nanowire arrays were synthesized by an ammonolysis reaction of copper oxide precursors grown on copper surfaces in an ammonia solution. The starting Cu films were deposited on a silicon substrate using two different methods: thermal ev
Publikováno v:
Applied Surface Science. 451:32-39
Microstructural and opto-electronic properties of Au ⧹ Sn and Sn ⧹ Au bilayers, obtained by sequential evaporating of metals on the Si substrate, were investigated by means of atomic force microscopy, X-ray diffraction and spectroscopic ellipsome
Publikováno v:
Journal of Alloys and Compounds. 849:156041
Microstructure and opto-electronic properties of thin films strongly depend on the deposition conditions. The 50 nm gold-tin alloy (Au-50%at.Sn and Au-67%at.Sn) layers were prepared using the physical vapour deposition technique. The tin and gold lay