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of 3
pro vyhledávání: '"Tomasz Jewula"'
Autor:
D. Beckmeier, T. Sulima, Tomasz Jewula, Walter Hansch, R. Nüssl, Werner Ruile, C. Senft, Ignaz Eisele
Publikováno v:
Thin Solid Films. 519:8154-8160
Ultra thin titanium films in the range of a few nanometers have been deposited on monocrystalline lithiumtantalate (LiTaO3) followed by deposition of 400 nm pure aluminum (Al). Texture measurements by means of electron backscatter diffraction show th
Autor:
Ignaz Eisele, Charles Binninger, Werner Ruile, Walter Hansch, R. Drozd, R. Nüssl, D. Beckmeier, Tomasz Jewula, T. Sulima
Publikováno v:
Materials Characterization. 61:1054-1060
To explore mechanical stress durability of thin aluminum–scandium (AlSc) films, 0.86 GHz nano resonators with AlSc electrodes have been manufactured. Four different samples have been prepared altering the Sc content in the alloy between 0.0% and 2.
Publikováno v:
2012 IEEE International Ultrasonics Symposium.
Surface Acoustic Wave (SAW) filters are important frequency selective components in the front-end of many modern communication devices using wireless data transmission. As a result of device miniaturisation the acoustic power density in SAW filters i