Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Tom Turpin"'
Autor:
Tom Turpin, Steve Yaninek
Publikováno v:
American Entomologist. 65:250-257
Autor:
Tom Turpin
Publikováno v:
2016 International Congress of Entomology.
Autor:
Tom Turpin
From the Introduction:I'll ask the question for you esteemed reader, what divine proclamation anointed your humble scribe the guru of all the cartridges that exists? The answer is simple, there is no such anointment. Well, perhaps my publisher indica
Autor:
Tom Turpin
Beauty, function, flair--art! Welcome to Modern Custom Guns, 2nd Edition! Noted author and firearms expert Tom Turpin once again brings the reader a celebration of today's most talented custom gun artisans. Told beautifully in both words and stunning
Autor:
Tom Turpin
Behind the Scenes at David Miller Co.Join author Tom Turpin for a look at how some of the world's finest bolt-action rifles become functional works of art, after first being nothing more than wood and metal.Learn how true masters ply their talentsSee
Autor:
Gaines E. Miles, Yael Edan, F. Tom Turpin, Avshalom Grinstein, Thomas N. Jordan, Amots Hetzroni, Stephen C. Weller, Marvin M. Schreiber, Okan K. Ersoy
In this work multispectral reflectance images are used in conjunction with a neural network classifier for the purpose of detecting and classifying weeds under real field conditions. Multispectral reflectance images which contained different combinat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91861afbd1369e26c81dc1efd916f671
https://doi.org/10.32747/1995.7570567.bard
https://doi.org/10.32747/1995.7570567.bard
Autor:
Eldon E. Ortman, Randall A. Higgins, Lawrent L. Buschman, Richard L. Hellmich, Blair D. Siegfried, F. Tom Turpin, Marlin E. Rice, Billy W. Fuller, Dennis D. Calvin, Richard T. Roush, Kenneth R. Ostlie, Gary P. Munkvold, Thomas E. Hunt, John E. Foster, Galen P. Dively, B. Dean Barry, Anthony M. Shelton, Kevin L. Steffey, Phillip E. Sloderbeck, Mark K. Sears, Janet Carpenter, John L. Wedberg
Publikováno v:
BioScience. 51:900