Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Tom Theis"'
Publikováno v:
Computer Analysis of Images and Patterns ISBN: 9783030891275
CAIP (1)
CAIP (1)
Class imbalance is an inherent problem in many machine learning classification tasks. This often leads to learned models that are unusable for any practical purpose. In this study, we explore an unsupervised approach to address class imbalance by lev
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::895b76ced5e15c9fff099019d54a17ab
https://doi.org/10.1007/978-3-030-89128-2_31
https://doi.org/10.1007/978-3-030-89128-2_31
Autor:
John Shalf, Paul Ohodnicki, Sreekant Narumanchi, Suman Datta, Srabanti Chowdhury, Eric Colby, Todd C. Monson, Andy Schwartz, Vicki Skonicki, Dushan Boroyevich, Tsu-Jae King Liu, Simon S. Ang, Justin R. Rattner, Valerie Taylor, Supratik Guha, Harry A. Atwater, Mark A. Hollis, Kerstin Kleese van Dam, Jerry A. Simmons, Matthew J. Marinella, Ramamoorthy Ramesh, Debdeep Jena, Katie Runkles, James A. Ang, Robinson E. Pino, Gil Herrera, Tom Theis, Michael Witherell, Jack Flicker, Khurram K. Afridi, Sayeef Salahuddin, Robert Kaplar, Joseph E. Harmon, Noble M. Johnson, Michele Nelson, Sriram Krishnamoorthy, Shadi Shahedipour-Sandvik, William J. Chappell, Daniel A. Reed, Peter M. Kogge, Jon Bock, Michael L. Schuette, Kenneth A. Jones, Keith S. Evans, Rick Stevens, Cherry Murray, Thomas M. Conte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0e09a10f40d1c05f9ad0dd024312976
https://doi.org/10.2172/1616249
https://doi.org/10.2172/1616249
Publikováno v:
Nanotechnology Research Directions for Societal Needs in 2020 ISBN: 9789400711679
In the last 10 years, the state of the art in nanoelectronics, including nanomagnetics, has rapidly gone from devices at or above 100 nm in size to the realm of 30 nm and below, with a well-defined pathway to devices (including transistors for logic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::02cd289381245903df56231d9717e1e4
https://doi.org/10.1007/978-94-007-1168-6_9
https://doi.org/10.1007/978-94-007-1168-6_9