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pro vyhledávání: '"Tom Raines"'
Autor:
Luis A. Trevino, Tom Raines, Richard Barido, Robert Lerner, Jeff Knudsen, Christine W. Jarvis, Todd Dalland, Peter Heppel, Anthony B. Campbell, Allen K. MacKnight
Publikováno v:
SAE Technical Paper Series.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b30e565518f496b168cbabeb70eefd57
https://doi.org/10.4271/2002-01-2314
https://doi.org/10.4271/2002-01-2314
