Zobrazeno 1 - 10
of 26
pro vyhledávání: '"Tom Davenport"'
Autor:
Tom Davenport, Jim Euchner
Publikováno v:
Research-Technology Management. 66:11-15
Elgar Advanced Introductions are stimulating and thoughtful introductions to major fields in the social sciences, business and law, expertly written by the world's leading scholars. Designed to be accessible yet rigorous, they offer concise and lucid
Autor:
Allen Barnett, Douglas Kirkpatrick, Christiana Honsberg, Duncan Moore, Mark Wanlass, Keith Emery, Richard Schwartz, Dave Carlson, Stuart Bowden, Dan Aiken, Allen Gray, Sarah Kurtz, Larry Kazmerski, Myles Steiner, Jeffery Gray, Tom Davenport, Roger Buelow, Laszlo Takacs, Narkis Shatz, John Bortz, Omkar Jani, Keith Goossen, Fouad Kiamilev, Alan Doolittle, Ian Ferguson, Blair Unger, Greg Schmidt, Eric Christensen, David Salzman
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6aafdc02d80c84faf8891e761c4a709d
https://doi.org/10.4324/9781315793245-49
https://doi.org/10.4324/9781315793245-49
Autor:
Greg Schmidt, Duncan T. Moore, Keith W. Goossen, Mark Wanlass, John C. Bortz, Daniel J. Aiken, Douglas Kirkpatrick, Stuart Bowden, Lawrence L. Kazmerski, David Salzman, Ian T. Ferguson, D.E. Carlson, Sarah Kurtz, J.L. Gray, A. Doolittle, Laszlo A. Takacs, Keith Emery, Eric R. Christensen, Omkar Jani, Christiana B. Honsberg, Tom Davenport, Roger F. Buelow, Fouad Kiamilev, Allen Barnett, Blair L. Unger, Narkis E. Shatz, Richard G. Schwartz, Myles A. Steiner, Allen L. Gray
Publikováno v:
Progress in Photovoltaics: Research and Applications. 17:75-83
The Very High Efficiency Solar Cell (VHESC) program is developing integrated optical system–PV modules for portable applications that operate at greater than 50% efficiency. We are integrating the optical design with the solar cell design, and have
Publikováno v:
Integrated Ferroelectrics. 48:161-169
The requirements for future ferroelectric non-volatile memories (FRAM) include lower operating voltages, higher densities and tighter design rules. In order to achieve these requirements the key component of the FRAM device, viz., the PbZr x Ti 1 m x
Publikováno v:
Integrated Ferroelectrics. 36:43-52
Lower operating voltage is one of the main requirements of future generation FRAM. In order to achieve this requirement, PLZT thin film capacitors must be scaled down with respect to thickness. This paper presents the ferroelectric performance of sca
Autor:
Tom Davenport, Sanjay Mitra
Publikováno v:
Integrated Ferroelectrics. 31:213-231
Ferroelectric memories have been firmly established commercially over the past decade. This paper presents the process variations used by Ramtron for its portion of the worldwide FRAM output and discusses the reasons why the particular process was ch
Publikováno v:
Journal of American Folklore. 113:200-203
Publikováno v:
Integrated Ferroelectrics. 27:271-277
This study seeks to determine the feasibility and suitability of SBTN as a ferroelectric material used in the semiconductor wafer fabrication process. While Ramtron has years of experience producing PZT based parts, one vision for the future is that