Zobrazeno 1 - 10
of 788
pro vyhledávání: '"Tolpygo A"'
Autor:
Andreeva I.V., Tolpygo A.V., Andreev V.A., Azyzov I.S., Golman I.A., Osipova N.N., Privolnev V.V., Stetsiouk O.U., Sokolovskaya V.V.
Publikováno v:
Клиническая микробиология и антимикробная химиотерапия, Vol 24, Iss 2, Pp 108-133 (2022)
Psychobiotics are a special class of probiotics that have a beneficial effect on human mental health. During the last decade, convincing evidence has emerged that the gut microbiome influences mental health, cognitive abilities (learning and memory),
Externí odkaz:
https://doaj.org/article/a18d7ef17afb4358b2e6f238261e72ca
Autor:
Tolpygo, Sergey K., Golden, Evan B., Ayala, Christopher L., Schindler, Lieze, Johnston, Michael A., Parmar, Neel, Yoshikawa, Nobuyuki
Adiabatic quantum-flux-parametron (AQFP) logic is a proven energy-efficient superconductor technology for various applications. To address the scalability challenges, we investigated AQFP shift registers with the AQFP footprint area reduced by 25% wi
Externí odkaz:
http://arxiv.org/abs/2411.04045
Autor:
Meninger, Scott E., Tolpygo, Sergey K.
Moats in superconducting ground planes are used to trap magnetic flux away from sensitive parts of superconductor integrated circuits. We simulate the effect of magnetic flux trapped in moats on the operating margins of ac-biased SFQ shift registers
Externí odkaz:
http://arxiv.org/abs/2411.02749
To increase integration scale of superconductor electronics, we are developing a new, SFQ7ee, node of the fabrication process at MIT Lincoln Laboratory. In comparison to the existing SFQ5ee node, we increased the number of fully planarized supercondu
Externí odkaz:
http://arxiv.org/abs/2312.13475
Progress toward superconductor electronics fabrication process with planarized NbN and NbN/Nb layers
Autor:
Tolpygo, Sergey K., Mallek, Justin L., Bolkhovsky, Vladimir, Rastogi, Ravi, Golden, Evan B., Weir, Terence J., Johnson, Leonard M., Gouker, Mark A.
To increase density of superconductor digital and neuromorphic circuits by 10x and reach integration scale of $10^8$ Josephson junctions (JJs) per chip, we developed a new fabrication process on 200-mm wafers, using self-shunted Nb/Al-AlOx/Nb JJs and
Externí odkaz:
http://arxiv.org/abs/2302.06830
Superconductor single flux quantum (SFQ) technology is attractive for neuromorphic computing due to low energy dissipation and high, potentially up to 100 GHz, clock rates. We have recently suggested a new family of bioSFQ circuits (V.K. Semenov et a
Externí odkaz:
http://arxiv.org/abs/2212.13657
We present measurements of the self- and mutual inductance of NbN and bilayer NbN/Nb inductors with Nb ground plane(s) fabricated in an advanced process for superconductor electronics developed at MIT Lincoln Laboratory. In this process, the signal t
Externí odkaz:
http://arxiv.org/abs/2210.10705
Autor:
Tolpygo, Sergey K.
Publikováno v:
IEEE Trans. Appl. Supercond., vol. 33, no. 2, pp. 1-19, Mar. 2023, Art no. 1300419
Flux transformers are the necessary component of all superconductor digital integrated circuits utilizing ac power for logic cell excitation and clocking, and flux biasing, e.g., Adiabatic Quantum Flux Parametron (AQFP), Reciprocal Quantum Logic, sup
Externí odkaz:
http://arxiv.org/abs/2210.02632
Publikováno v:
IEEE Trans. Appl. Supercond., vol. 32, no. 5, pp. 1-31, Aug. 2022, Art. no. 1400331
Data are presented on mutual and self-inductance of various inductors used in multilayered superconductor integrated circuits: microstrips and striplines with widths of signal traces from 250 nm to a few micrometers, located on the same circuit layer
Externí odkaz:
http://arxiv.org/abs/2112.08457
Autor:
West, Joshua T., Kurlej, Arthur, Wynn, Alex, Rogers, Chad, Gouker, Mark A., Tolpygo, Sergey K.
Publikováno v:
IEEE Trans. Appl. Supercond., vol. 32, no. 5, pp. 1-12, Aug. 2022, Art no. 9500712
Using a fully automated cryogenic wafer prober, we measured superconductor fabrication process control monitors and simple integrated circuits on 200 mm wafers at 4.4 K, including SQIF-based magnetic field sensors, SQUID-based circuits for measuring
Externí odkaz:
http://arxiv.org/abs/2112.00705