Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Tobias Liese"'
Autor:
Cynthia A. Volkert, K. R. Mangipudi, Hans-Ulrich Krebs, Tobias Liese, Inga Knorr, Andreas Kelling
Publikováno v:
Scripta Materialia. 115:42-45
In-situ transmission electron microscopy is used to investigate crack propagation parallel to the interfaces of a Ti/ZrO 2 multilayer. The cracks propagate along the middle of the 100 nm thick polycrystalline Ti layers, causing extensive dislocation
Autor:
Felix Schlenkrich, S. Hoffmann, Christian Eberl, Henning Ulrichs, Michael Seibt, Tobias Liese, Simone Pisana, Florian Döring, Markus Münzenberg, Maria Mansurova, S. Schlenkrich, Hans-Ulrich Krebs, T. Santos, Henning Schuhmann, Vladyslav Zbarsky
Publikováno v:
Applied Physics A. 119:11-18
An efficient way for minimizing phonon thermal conductivity in solids is to nanostructure them by means of reduced phonon mean free path, phonon scattering and phonon reflection at interfaces. A sophisticated approach toward this lies in the fabricat
Autor:
Hans-Ulrich Krebs, Felix Schlenkrich, Christian Eberl, Florian Döring, Hans Hofsäss, Tobias Liese
Publikováno v:
Applied Physics A. 111:431-437
During growth of multilayers by pulsed laser deposition (PLD), often both intermixing and resputtering occur due to the high kinetic energy of the particles transferred from the target to the substrate surface. In order to obtain a fundamental unders
Autor:
Hans-Ulrich Krebs, Tobias Liese, Klaus Mann, Michael Reese, Volker Radisch, Peter Großmann, Inga Knorr
Publikováno v:
Applied Surface Science. 257:5138-5141
As a novel approach, the combination of pulsed laser deposition and focused ion beam was applied to fabricate different types of multilayer zone plate structures for soft X-ray applications. For this purpose, high quality non-periodic ZrO2/Ti multila
Autor:
Klaus Mann, Peter Großmann, Michael Reese, Armin Bayer, Hans-Ulrich Krebs, Tobias Liese, Bernd Schäfer
Publikováno v:
Applied Physics A. 102:85-90
The focusing properties of a one-dimensional multilayer Laue lens (MLL) were investigated using monochromatic soft X-ray radiation from a table-top, laser-produced plasma source. The MLL was fabricated by a focused ion beam (FIB) structuring of pulse
Autor:
Markus Osterhoff, Arno Rauschenbeutel, Tobias Liese, Matthias Bartels, Christian Eberl, S. Hoffmann, Thomas Hoinkes, Florian Döring, Tim Salditt, Felix Schlenkrich, A. Ruhlandt, Anna-Lena Robisch, Volker Radisch, Hans-Ulrich Krebs
Publikováno v:
SPIE Proceedings.
We present experiments carried out using a combined hard x-ray focusing set-up preserving the benefits of a large-aperture Kirckpatrick-Baez (KB) mirror system and a small focal length multilayer zone plane (MZP). The high gain KB mirrors produce a p
Autor:
Matthias Bartels, Florian Döring, Markus Osterhoff, Hans-Ulrich Krebs, Felix Schlenkrich, Christian Eberl, S. Hoffmann, Tim Salditt, A. Ruhlandt, Tobias Liese, Anna-Lena Robisch
Publikováno v:
Optics express 21(16), 19311 (2013). doi:10.1364/OE.21.019311
Optics express 21(16), 19311 (2013). doi:10.1364/OE.21.019311
Published by Soc., Washington, DC
Published by Soc., Washington, DC
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::671b35c2200015097782ca28ee5f7b58
https://bib-pubdb1.desy.de/record/167761
https://bib-pubdb1.desy.de/record/167761
Autor:
Susanne Seyffarth, Felix Büttner, Hans-Ulrich Krebs, Kun Zhang, Carlos A. F. Vaz, Hans Hofsäss, Tobias Liese
Publikováno v:
Physical Review B. 84
Grazing incidence Xe${}^{+}$ ion sputtering was used to create a nanoscale ripple pattern on a thin Fe film, epitaxially grown on MgO(001). The Fe film has a thickness gradient of 0--20 nm and a ripple height of about 3 nm, giving rise to a transitio
Autor:
Tim Salditt, A. Ruhlandt, Hans-Ulrich Krebs, Tobias Liese, S. P. Krüger, Klaus Giewekemeyer, Volker Radisch, Markus Osterhoff
Publikováno v:
AIP Advances, Vol 2, Iss 1, Pp 012175-012175-7 (2012)
AIP Advances 2, 012175 (2012). doi:10.1063/1.3698119
AIP Advances 2, 012175 (2012). doi:10.1063/1.3698119
We have used a combined optical system of a high gain elliptic Kirkpatrick-Baez mirror system (KB) and a multilayer Laue lens (MLL) positioned in the focal plane of the KB for hard x-rays nano-focusing. The two-step focusing scheme is based on a high
Publikováno v:
Review of Scientific Instruments. 81:073710
X-ray diffractive techniques using Fresnel zone plate lenses of various forms are of great technical interest because of their ability to form images at very high spatial resolution, but the zone plates are unfortunately very hard to produce by litho