Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Timpano RJ"'
Autor:
Orr RK; Global Regulatory Affairs, Chemistry Manufacturing and Controls, Merck & Co., Inc., 126 E. Lincoln Ave, PO Box 2000, Rahway, New Jersey, 07065, USA. robert.orr@merck.com., Rawalpally T; Regulatory Affairs, Chemistry, Manufacturing and Controls, AstraZeneca BioPharmaceutical Inc., 1 Medimmune Way, Gaithersburg, MD, 20878, USA. thimma.rawalpally@astrazeneca.com., Gorka LS; Global Regulatory Sciences, Chemistry Manufacturing and Controls, Pfizer Inc., Pfizer Research and Development, New York, NY, 10001, USA. lindsey.saunders.gorka@pfizer.com., Bonaga LR; Global Regulatory Affairs, Chemistry Manufacturing and Controls, Merck & Co., Inc., 126 E. Lincoln Ave, PO Box 2000, Rahway, New Jersey, 07065, USA., Schenck L; Oral Formulation Sciences, Merck & Co., Inc., Rahway, NJ, 07065, USA., Osborne S; Global Regulatory Affairs - Chemistry, Manufacturing and Controls, Eli Lilly & Company, Indianapolis, Indiana, 46285, USA., Erdemir D; Drug Product Development, Bristol-Myers Squibb, 1 Squibb Drive, New Brunswick, New Jersey, 08903, USA., Timpano RJ; Global Regulatory Sciences, Chemistry Manufacturing and Controls, Pfizer Inc., Pfizer Research and Development, Groton, CT, 06340, USA., Zhang H; Chemical Process R&D, Sunovion Pharmaceuticals Inc., 84 Waterford Drive, Marlborough, MA, 01752, USA.
Publikováno v:
The AAPS journal [AAPS J] 2024 Dec 17; Vol. 27 (1), pp. 16. Date of Electronic Publication: 2024 Dec 17.
Autor:
Waterman KC; Pfizer Global Research and Development, Eastern Point Road 8156-21, Groton, Connecticut 06340, USA. ken.waterman@pfizer.com, Arikpo WB, Fergione MB, Graul TW, Johnson BA, Macdonald BC, Roy MC, Timpano RJ
Publikováno v:
Journal of pharmaceutical sciences [J Pharm Sci] 2008 Apr; Vol. 97 (4), pp. 1499-507.
Autor:
am Ende MT; Pfizer Global Research & Development, Groton, CT, USA. Mary.T.am.Ende@pfizer.com, Moses SK, Carella AJ, Gadkari RA, Graul TW, Otano AL, Timpano RJ
Publikováno v:
Pharmaceutical development and technology [Pharm Dev Technol] 2007; Vol. 12 (4), pp. 391-404.