Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Timothy J. Koprowski"'
Autor:
Mary P. Kusko, T.G. Foote, Bryan J. Robbins, William V. Huott, Timothy J. Koprowski, D.E. Hoffman
Publikováno v:
IEEE Design & Test of Computers. 15:83-89
The design-for-test framework of the 500-MHz CMOS central processor uses specific tests to ensure the highest reliability of components within a system. Some of the same test patterns are applied in chip manufacturing and system-level tests.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d22e225dc7da4201e6d70f14b23b05d
https://doi.org/10.1109/54.706038
https://doi.org/10.1109/54.706038
Autor:
Timothy G. McNamara, T.J. Snethen, Timothy J. Koprowski, William V. Huott, S. V. Pateras, Dale Eugene Hoffman, Mary P. Kusko, Bryan J. Robbins
Publikováno v:
IBM Journal of Research and Development. 41:611-627
This paper describes the overall test methodology used in implementing the S/390® microprocessor and the associated L2 cache array in shared multiprocessor designs, the design-for-test implementations, and the test software used in creating the test
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e6892d288e9429b096c3d9517f24ff0c
https://doi.org/10.1147/rd.414.0611
https://doi.org/10.1147/rd.414.0611
Autor:
T.G. Foote, William V. Huott, Bryan J. Robbins, Mary P. Kusko, Timothy J. Koprowski, D.E. Hoffman
Publikováno v:
ITC
This paper describes the design-for-test framework of the 400 MHz CMOS central processor (CP) used in the fourth generation (G4) of the IBM S/390(R) line of servers. It will describe details of modeling logic to achieve correct and effective tests as
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d5082babc289769754bdf011f92aa97f
https://doi.org/10.1109/test.1997.639601
https://doi.org/10.1109/test.1997.639601
Conference
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Publikováno v:
Proceedings International Test Conference 2001 (Cat. No.01CH37260); 2001, p586-592, 7p
Publikováno v:
Proceedings International Test Conference 1997; 1997, p106-114, 9p
Publikováno v:
IEEE Design & Test of Computers; 1998, Vol. 15 Issue 3, p83-89, 7p