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pro vyhledávání: '"Timothy J Perham"'
Publikováno v:
Proceedings GaAs Reliability Workshop, 2003..
We have used high-resolution transmission electron microscopy (HRTEM), with focused-ion-beam preparation of foils, to study InP HBT devices, both as-fabricated and after aging in life tests. The technology is HRL's G1 process. We found that even afte
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f9b0f204ce3adb24dec4b0ca74100bb2
https://doi.org/10.1109/gaasrw.2003.183769
https://doi.org/10.1109/gaasrw.2003.183769
