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pro vyhledávání: '"Timothy H. Gfroerer"'
Autor:
Fan Zhang, Jose F. Castaneda, Timothy H. Gfroerer, Daniel Friedman, Yong-Hang Zhang, Mark W. Wanlass, Yong Zhang
Publikováno v:
Light: Science & Applications, Vol 11, Iss 1, Pp 1-12 (2022)
A measurement of PL intensity vs. excitation density, with the help of Raman, is shown capable of determine nearly all pertinent parameters of radiative and nonradiative recombination in a semiconductor.
Externí odkaz:
https://doaj.org/article/33e464bf63ba47b4bd4365305ed74276
