Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Tim D. Andreadis"'
Publikováno v:
Frontiers in Neurology, Vol 11 (2020)
Pulsed microwaves above specific energy thresholds have been reported to cause brain injury in animal models. The actual physical mechanism causing brain damage is unexplained while the clinical reality of these injuries remains controversial. Here w
Externí odkaz:
https://doaj.org/article/535eb368fba0410eb0f67d1a95973604
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility. 58:1535-1540
A statistical modeling technique known as the random coupling model (RCM) is an effective method for estimating the probabilistic magnitudes of induced voltages on objects within a closed, complex, three-dimensional (3-D) enclosure. The limitations o
Autor:
Jesus Gil Gil, Zachary B. Drikas, Sun K. Hong, Jen-Hao Yeh, Tim D. Andreadis, Biniyam Tesfaye Taddese, Steven M. Anlage
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility. 56:1480-1487
The effectiveness of the random coupling model (RCM) in predicting electromagnetic wave coupling to targeted electronic components within a complex enclosure is examined. In the short-wavelength limit with respect to the characteristic length of the
Autor:
J. Gil Gil, Steven M. Anlage, Tim D. Andreadis, Sun K. Hong, Edward Ott, Thomas M. Antonsen, Biniyam Tesfaye Taddese, Zachary B. Drikas, Jen-Hao Yeh
Publikováno v:
Acta Physica Polonica A. 124:1045-1052
Random matrix theory (RMT) successfully predicts universal statistical properties of complicated wave scattering systems in the semiclassical limit, while the random coupling model offers a complete statistical model with a simple additive formula in
Publikováno v:
Journal of Electromagnetic Waves and Applications. 27:1262-1275
In this paper, we demonstrate the use of a time reversal (TR) technique to effectively focus an arbitrary RF pulse at a remote location from a single-feed aperture for directed energy applications. The TR focusing is achieved by backing the aperture
Autor:
Louis F. Libello, A. I. Namenson, Terence J. Wieting, C.M. Butler, John M. Kidd, Tim D. Andreadis, Christian D. Schleisiger, Wayne Quade
Publikováno v:
COMPEL - The international journal for computation and mathematics in electrical and electronic engineering. 14:223-227
The behaviours of the electric and magnetic fields inside a conducting cylinder with a single axial aperture are not as well understood as is commonly believed. The experimental measurements and computer simulations described in this paper comprise a
Here we consider the convergence of the singularity expansion method (SEM) pole series representation of the transient backscatter in terms of the stability in the estimated poles from the time domain response. Using a numerically simulated backscatt
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4a275dfd9b450fd822e8b3f32bf947ee
https://doi.org/10.21236/ada559950
https://doi.org/10.21236/ada559950
Autor:
Jesus Gil Gil, Tim D. Andreadis, Frank Bucholtz, Ross T. Schermer, Carl A. Villarruel, Keith J. Williams
These results demonstrate the ability of a commercial LiNbO3 EO modulator to withstand damage from direct pulsed RF input up to 200 W. However, short-term disruption occurred at a few Watts, which suggests a need for improved modulator thermal design
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7fbd63142229dee7b95f34f152f43104
https://zenodo.org/record/1265220
https://zenodo.org/record/1265220
In April of 2005, several pulsed-power experiments were performed using explosively driven voltage generation systems at Loki Inc. located in Rolla, Missouri. A pulse-forming network and transmitting antenna were constructed and attached to the volta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c50adf1d2f517c7ea93907a4ca2ac071
https://doi.org/10.21236/ada438014
https://doi.org/10.21236/ada438014
Autor:
J. Gil Gil, Patrick Knapp, Tim D. Andreadis, Carl A. Villarruel, Keith J. Williams, Frank Bucholtz, J. Shue, Ross T. Schermer
Publikováno v:
Electronics Letters. 45:272
The first measurement of the susceptibility of an off-the-shelf lithium-niobate intensity modulator to damage and disruption from high-power microwave pulses is reported. The device tested survived 1 kHz repetition rate pulses at 2.5 GHz centre frequ