Zobrazeno 1 - 10
of 63
pro vyhledávání: '"Tim, Grieb"'
Autor:
Christoph Mahr, Jakob Stahl, Beeke Gerken, Valentin Baric, Max Frei, Florian F. Krause, Tim Grieb, Marco Schowalter, Thorsten Mehrtens, Einar Kruis, Lutz Mädler, Andreas Rosenauer
Publikováno v:
Nano Select, Vol 5, Iss 4, Pp n/a-n/a (2024)
Abstract Formation of hetero‐contacts between particles of different materials in nanoparticle hetero‐aggregates can lead to new functional properties. Improvement of the functional behavior requires a detailed characterization of mixing between
Externí odkaz:
https://doaj.org/article/bb5f6c734fc04ee5ab2b8e90a9c1c3a9
Autor:
Christoph Mahr, Knut Müller-Caspary, Matthias Graf, Anastasia Lackmann, Tim Grieb, Marco Schowalter, Florian F. Krause, Thorsten Mehrtens, Arne Wittstock, Jörg Weissmüller, Andreas Rosenauer
Publikováno v:
Materials Research Letters, Vol 6, Iss 1, Pp 84-92 (2018)
Reversible macroscopic length changes in nanoporous structures can be achieved by applying electric potentials or by exposing them to different gases or liquids. Thus, these materials are interesting candidates for applications as sensors or actuator
Externí odkaz:
https://doaj.org/article/40ec3464803d4799ab4b7876fdf2a9a3
Autor:
Beeke Gerken, Christoph Mahr, Jakob Stahl, Tim Grieb, Marco Schowalter, Florian F. Krause, Thorsten Mehrtens, Lutz Mädler, Andreas Rosenauer
Publikováno v:
Particle & Particle Systems Characterization.
Autor:
Maximilian Ries, Felix Nippert, Benjamin März, Manuel Alonso-Orts, Tim Grieb, Rudolfo Hötzel, Pascal Hille, Pouria Emtenani, Eser Metin Akinoglu, Eugen Speiser, Julian Plaickner, Jörg Schörmann, Matthias Auf der Maur, Knut Müller-Caspary, Andreas Rosenauer, Norbert Esser, Martin Eickhoff, Markus R. Wagner
The luminescence of InxGa1−xN nanowires (NWs) is frequently reported with large red-shifts as compared to the theoretical value expected from the average In content. Both compositional fluctuations and radial built-in fields were considered account
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::aaa9ad6e4d7fe2a17859884b5f10696d
Autor:
Manuel Alonso-Orts, Rudolfo Hötzel, Tim Grieb, Matthias Auf der Maur, Maximilian Ries, Felix Nippert, Benjamin März, Knut Müller-Caspary, Markus R. Wagner, Andreas Rosenauer, Martin Eickhoff
Publikováno v:
Discover Nano. 18
The influence of self-assembled short-period superlattices (SPSLs) on the structural and optical properties of InGaN/GaN nanowires (NWs) grown by PAMBE on Si (111) was investigated by STEM, EDXS, µ-PL analysis and k·p simulations. STEM analysis on
Autor:
Cristian Messina, Yongkang Gong, Oumaima Abouzaid, Bogdan‐Petrin Ratiu, Tim Grieb, Zhao Yan, Andreas Rosenauer, Sang Soon Oh, Qiang Li
Publikováno v:
Advanced Optical Materials. 11
Autor:
Florian F. Krause, Marco Schowalter, Beeke Gerken, Dennis Marquardt, Tim Grieb, Thorsten Mehrtens, Christoph Mahr, Andreas Rosenauer
Publikováno v:
Ultramicroscopy. 245:113661
The ISTEM mode for TEM has been demonstrated to have several advantages in regard to resolution and precision. While previous works primarily focussed on the advantages due to the reduced spatial coherence, the actual image contrast, i.e. how bright
Autor:
Tim Grieb, Andreas Beyer, Damien Heimes, Andreas Rosenauer, Kerstin Volz, M Munde, Knut Müller-Caspary, Saleh Firoozabadi
Publikováno v:
Nano letters 21(5), 2018-2025 (2021). doi:10.1021/acs.nanolett.0c04544
Nano Letters
Nano Letters
Nano letters 21(5), 2018-2025 (2021). doi:10.1021/acs.nanolett.0c04544
Published by American Chemical Society, Washington, DC
Published by American Chemical Society, Washington, DC
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::403176c6086993bfc2227d711cdb243e
Autor:
Tim Grieb, Florian F. Krause, Knut Müller-Caspary, Jan-Philipp Ahl, Marco Schowalter, Oliver Oppermann, Joachim Hertkorn, Karl Engl, Andreas Rosenauer
Publikováno v:
Ultramicroscopy. 238:113535
In this paper we perform angular resolved annular-dark field (ADF) scanning-transmission electron microscopy (STEM) to study the scattered intensity in an InGaN layer buried in GaN as a function of the scattering angle. We achieved angular resolution
Publikováno v:
Ultramicroscopy. 236:113503
The measurement of electric fields in scanning transmission electron microscopy (STEM) is a highly investigated field of research. The constant improvement of spatial resolution in STEM and the development of new hardware for the fast acquisition of