Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Till Wallendorf"'
Autor:
Andreas Grohe, Haro Fritsche, Till Wallendorf, Bastian Kruschke, Axel Reich, Thomas Hagen, Ronny Steger, Holger Kern, Wolfgang Gries, Fabio Ferrario, Dennis Sanftleben, Ralf Koch
Publikováno v:
SPIE Proceedings.
The modular concept of DirectPhotonics laser systems is a big advantage regarding its manufacturability, serviceability as well as reproducibility. By sticking to identical base components an economic production allows to serve as many applications a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::784cafbfd40b17ed8634095a906e7dd4
https://doi.org/10.1117/12.2214067
https://doi.org/10.1117/12.2214067
Publikováno v:
Surface and Coatings Technology. :222-228
The use of aluminium doped zinc oxide (ZAO) as transparent conductive layer (TCO) has growing importance especially for production of solar modules. A significant cost reduction of TCO thin film production is expected by use of much less expensive me
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f40e689eb30ee31f1a8a0cac1881326f
https://doi.org/10.1016/s0257-8972(03)00696-0
https://doi.org/10.1016/s0257-8972(03)00696-0
Mixed optical materials open new possibilities for the design and optimization of thin film properties. For example the refractive index may be tuned between the refractive indices of the pure materials. Low film stress of mixed optical materials can
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6b0af9533454d42412541b9f91baccff
https://publica.fraunhofer.de/handle/publica/227907
https://publica.fraunhofer.de/handle/publica/227907
Publikováno v:
ResearcherID
A novel acousto-optic spectrometer (IfU Diagnostic Systems GmbH) for 2-dimensional (2D) optical emission spectroscopy with high spectral resolution has been developed. The spectrometer is based on acousto-optic tuneable filter technology with fast ra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ac6e5c30fe08a2c2b64a2bab30b02445
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=ISI&KeyUT=WOS:000232327800189&KeyUID=WOS:000232327800189
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=ISI&KeyUT=WOS:000232327800189&KeyUID=WOS:000232327800189
Conference
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Autor:
Scharif, Wolfram, Wallendorf, Till
Publikováno v:
IEEE Transactions on Plasma Science; Apr2005 Part 1 of 3, Vol. 33 Issue 2, p386-387, 2p