Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Tijn van Omme"'
Autor:
Oscar Recalde-Benitez, Tianshu Jiang, Robert Winkler, Yating Ruan, Alexander Zintler, Esmaeil Adabifiroozjaei, Alexey Arzumanov, William A. Hubbard, Tijn van Omme, Yevheniy Pivak, Hector H. Perez-Garza, B. C. Regan, Lambert Alff, Philipp Komissinskiy, Leopoldo Molina-Luna
Publikováno v:
Communications Engineering, Vol 2, Iss 1, Pp 1-8 (2023)
Abstract Advanced nanomaterials are at the core of innovation for the microelectronics industry. Designing, characterizing, and testing two-terminal devices, such as metal-insulator-metal structures, is key to improving material stack design and inte
Externí odkaz:
https://doaj.org/article/67949337b138489992379497c532492b
Autor:
James L. Hart, Kanit Hantanasirisakul, Andrew C. Lang, Babak Anasori, David Pinto, Yevheniy Pivak, J. Tijn van Omme, Steven J. May, Yury Gogotsi, Mitra L. Taheri
Publikováno v:
Nature Communications, Vol 10, Iss 1, Pp 1-10 (2019)
Two-dimensional transition metal carbides and nitrides (MXenes) have emerged as highly conductive and stable materials, of promise for electronic applications. Here, the authors use in situ electric biasing and transmission electron microscopy to inv
Externí odkaz:
https://doaj.org/article/b77dfca2e62d4dc198dec064950223d7
Autor:
Ningyan Cheng, Hongyu Sun, Anne France Beker, J Tijn van Omme, Emil Svensson, Hamidreza Arandiyan, Hye Ryoung Lee, Binghui Ge, Shibabrata Basak, Rüdiger A Eichel, Yevheniy Pivak, Qiang Xu, H Hugo Pérez Garza, Zongping Shao
Publikováno v:
Nanotechnology 33(44), 445702 (2022). doi:10.1088/1361-6528/ac83c7
Liquid phase transmission electron microscopy (TEM) provides a useful means to study a wide range of dynamics in solution with near-atomic spatial resolution and sub-microsecond temporal resolution. However, it is still a challenge to control the che
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ae92722e6a3548c836cfef1bbdeb0d0c
https://pubmed.ncbi.nlm.nih.gov/35878519
https://pubmed.ncbi.nlm.nih.gov/35878519
Autor:
Oscar Recalde, Tianshu Jiang, Robert Eilhardt, Alexander Zintler, Yating Ruan, Alexey Arzumanov, Tijn van Omme, Gin Pivak, Hector H Perez-Garza, Philipp Komissinskiy, Lambert Alff, Leopoldo Molina-Luna
Publikováno v:
Microscopy and Microanalysis. 28:820-821
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d20bbd4cb806a07d0cb626ce246a135c
https://doi.org/10.1017/s1431927622003671
https://doi.org/10.1017/s1431927622003671
Autor:
J. Tijn van Omme, Hanglong Wu, Hongyu Sun, Anne France Beker, Mathilde Lemang, Ronald G. Spruit, Sai P. Maddala, Alexander Rakowski, Heiner Friedrich, Joseph P. Patterson, H. Hugo Pérez Garza
Publikováno v:
Journal of Materials Chemistry C, 8(31), 10781-10790. Royal Society of Chemistry
Journal of Materials Chemistry C
Journal of Materials Chemistry C
Liquid phase transmission electron microscopy has become a powerful tool for imaging the structure and dynamics of materials in solution. Direct observation of material formation, modification and operation has provided unique insights into the chemi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::06df67b75cc2ecd30eb0f65d77d09209
https://research.tue.nl/nl/publications/40718fe9-b1c0-4474-b258-7a9e241facc7
https://research.tue.nl/nl/publications/40718fe9-b1c0-4474-b258-7a9e241facc7
Autor:
Ronald G. Spruit, Hector Hugo Perez Garza, J. Tijn van Omme, Marina Zakhozheva, Mariya Sholkina
Publikováno v:
Ultramicroscopy. 192:14-20
In this work we present our advanced in situ heating sample carrier for transmission electron microscopy (TEM). The TEM is a powerful tool for materials characterization, especially when combined with micro electro-mechanical systems (MEMS). These de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f18f35f90ad196c21e40f9017beb4a32
https://doi.org/10.1016/j.ultramic.2018.05.005
https://doi.org/10.1016/j.ultramic.2018.05.005
Publikováno v:
Journal of Microelectromechanical Systems. 26:1165-1182
Microelectromechanical systems (MEMS)-based sample carriers became a breakthrough for in situ inspection techniques, especially in transmission electron microscopy where the sample carrier functions as a microsized laboratory and enables dynamic stud
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::93a4edfc050de17e2ca2239d87195c01
https://doi.org/10.1109/jmems.2017.2757402
https://doi.org/10.1109/jmems.2017.2757402
Autor:
van Ravenhorst, Ilse K., Geitenbeek, Robin G., van der Eerden, M. J., Tijn van Omme, J., Peréz Garza, H. Hugo, Meirer, Florian, Meijerink, Andries, Weckhuysen, Bert M.
In situ and operando experiments play a crucial role in understanding the mechanisms behind catalytic processes. In these experiments it is important to have precise control over pressure and temperature. In this work, we use luminescence thermometry
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______101::a7de82ceae7dae3ae0b39eb4a6d020ef
https://dspace.library.uu.nl/handle/1874/391265
https://dspace.library.uu.nl/handle/1874/391265
Autor:
Mitra L. Taheri, David Pinto, Babak Anasori, Andrew C. Lang, Yury Gogotsi, Kanit Hantanasirisakul, Steven J. May, Yevheniy Pivak, James L. Hart, J. Tijn van Omme
Publikováno v:
Nature Communications
Nature Communications, Vol 10, Iss 1, Pp 1-10 (2019)
Nature Communications, Vol 10, Iss 1, Pp 1-10 (2019)
MXenes are an emerging family of highly-conductive 2D materials which have demonstrated state-of-the-art performance in electromagnetic interference shielding, chemical sensing, and energy storage. To further improve performance, there is a need to i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::835b4a03f9beb84eca89e5ef58c963e2
http://europepmc.org/articles/PMC6355901
http://europepmc.org/articles/PMC6355901
Autor:
Ravenhorst, Ilse K., Geitenbeek, Robin G., Eerden, M. J., Tijn van Omme, J., Peréz Garza, H. Hugo, Meirer, Florian, Meijerink, Andries, Weckhuysen, Bert M.
Publikováno v:
ChemCatChem; 11/21/2019, Vol. 11 Issue 22, p5505-5512, 8p