Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Tijmen Vermeij"'
Autor:
Pushkar Prakash Dhekne, Tijmen Vermeij, Vivek Devulapalli, Suraj Dinkar Jadhav, Johan P.M. Hoefnagels, Marc G.D. Geers, Kim Vanmeensel
Publikováno v:
Scripta Materialia, 233:115505. Elsevier
Industrial implementation of heat-treated Laser Powder Bed Fusion (L-PBF) processed Ti-6Al-4 V components requires a thorough understanding of the plastic deformation mechanisms to predict the part performance in safety-critical environments. Here, w
Autor:
Thomas Morgan, Th. Loewenhoff, J.A.W. van Dommelen, Kim Verbeken, Marius Wirtz, Tijmen Vermeij, Johan P.M. Hoefnagels, Y. Li, G. De Temmerman, Marc G.D. Geers, J.W.M. Vernimmen
Publikováno v:
Nuclear Fusion, 61(4):046018. Institute of Physics
Nuclear Fusion
Nuclear Fusion, 61, 046018
Nuclear Fusion
Nuclear Fusion, 61, 046018
Tungsten and tungsten-based alloys are the leading material choices for the divertor plasma facing components (PFCs) in future fusion reactors. Recrystallization may occur when they undergo high heat loads, drastically modifying the predesigned grain
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b51af1abc4a75b8a4f2033201ac5ff16
https://research.tue.nl/nl/publications/a8e01c1c-31b3-4d69-8af6-13301fb2dc06
https://research.tue.nl/nl/publications/a8e01c1c-31b3-4d69-8af6-13301fb2dc06
Autor:
Marc G.D. Geers, Tijmen Vermeij, Lei Liu, V Varvara Kouznetsova, Johan P.M. Hoefnagels, F Francesco Maresca
Publikováno v:
Acta Materialia, 205:116533. Elsevier
Acta Materialia, 205:116533. PERGAMON-ELSEVIER SCIENCE LTD
Acta Materialia, 205:116533. PERGAMON-ELSEVIER SCIENCE LTD
Martensite/ferrite (M/F) interface damage plays a critical role in controlling failure of dual-phase (DP) steels and is commonly understood to originate from the large phase contrast between martensite and ferrite. This however conflicts with a few,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b89de4e818cce4fb03fb1cb70af16f10
https://research.tue.nl/nl/publications/a3a14695-e56c-4231-a010-d51fc0ca040f
https://research.tue.nl/nl/publications/a3a14695-e56c-4231-a010-d51fc0ca040f
Autor:
Johan P.M. Hoefnagels, Tijmen Vermeij
Publikováno v:
Scripta Materialia, 208:114327. Elsevier
The evolution of deformation from plasticity to localization to damage is investigated in ferritic-pearlitic steel through nanometer-resolution microstructure-correlated SEM-DIC (u-DIC) strain mapping, enabled through highly accurate microstructure-t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::20644240d3ef115bcf5dee4accb6224c
Publikováno v:
Strain, 55(6):e12330. Wiley-Blackwell
Digital Image Correlation (DIC) is of vital importance in the field of experimental mechanics, yet, producing suitable DIC patterns for demanding in-situ mechanical tests remains challenging, especially for ultra-fine patterns, despite the large numb
Autor:
Johan P.M. Hoefnagels, Tijmen Vermeij
Publikováno v:
Ultramicroscopy, 191, 44-50. Elsevier
A general, transparent, finite-strain Integrated Digital Image Correlation (IDIC) framework for high angular resolution EBSD (HR-EBSD) is proposed, and implemented through a rigorous derivation of the optimization scheme starting from the fundamental
Publikováno v:
Scripta Materialia, 162, 266-271. Elsevier
We report a first exploration of High-angular-Resolution Electron Backscatter Diffraction, without using simulated Electron Backscatter Diffraction patterns as a reference, for absolute stress and orientation measurements in polycrystalline materials
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::53a1ce07e1239e325d81b59e5c091d28
http://arxiv.org/abs/1807.03908
http://arxiv.org/abs/1807.03908
Publikováno v:
Microscopy and Microanalysis. 25:850-851
Publikováno v:
Ultramicroscopy. 186
Focused ion beam (FIB) milling has enabled the development of key microstructure characterization techniques (e.g. 3D electron backscatter diffraction (EBSD), 3D scanning electron microscopy imaging, site-specific sample preparation for transmission