Zobrazeno 1 - 10
of 53
pro vyhledávání: '"Tigran T. Mnatsakanov"'
High-Power Schottky Diodes with a Negative-Differential-Resistance Portion in the I–V Characteristic
Publikováno v:
Semiconductors. 55:92-99
It is shown that, in the base region of Schottky diodes, at current densities j higher than a certain value jst1, quasi-neutral drift-stimulated diffusion is implemented along with diffusion transport. The effect of this newly discovered mode in the
Publikováno v:
Semiconductors. 54:567-574
The effect of a set of quasi-neutral regimes of carrier transport in semiconductors, including, along with diffusion and drift, recently discovered diffusion stimulated by quasi-neutral drift, on the characteristics of structures is successively take
Publikováno v:
Semiconductors. 54:112-116
The procedure making it possible to take into account the influence of high-power thyristor design elements on its dU/dt parameter is described. A simple model is proposed, using which, it is possible to find the parameters of the auxiliary thyristor
Publikováno v:
Semiconductors. 51:1081-1086
An analytical expression is derived for the current–voltage characteristic of a Schottky diode at a high injection level of minority carriers. It is shown that, even at very high current densities, the higher the base doping level, the larger the v
Publikováno v:
Semiconductors. 51:798-802
Analytical expressions describing the dependences of the p +–n-junction leakage current on the doping level of the p +-type region are derived by taking into account a whole set of nonlinear physical effects: electron–hole scattering, Auger recom
Publikováno v:
Semiconductors. 51:225-231
The impact of non-1D effects caused by the spread of the gate current in the base layer on the gate switch-on current in 4H-SiC thyristors is considered. It is shown that a new switching mechanism implemented in 4H-SiC thyristors results in the depen
Publikováno v:
Solid-State Electronics. 121:41-46
Transport phenomena in Schottky diodes are analyzed at high injection levels of minority carriers. It is shown that the correct description of these phenomena requires that the mode of diffusion stimulated by the quasi-neutral drift (DSQD) should be
Publikováno v:
Semiconductors. 47:327-334
It is shown that violation of quasi-neutrality and its subsequent recovery (with an increase in the current density) may occur in doped n layers of p+-n-n+ structures under double injection at a high injection level and for a certain combination of e
Publikováno v:
Semiconductors. 46:1201-1206
A simple adiabatic model of the switch-on and turn-on spread in an optically triggered SiC thyristor has been developed. The model makes it possible to evaluate the overheating of the structure with consideration for the switched current I max, the r
Publikováno v:
Solid-State Electronics. 56:60-67
Criteria for occurrence of the quasineutral diffusion mode have been investigated in terms of a generalized approach that takes into account the dependences of the electron and hole velocities on the electric field. These criteria should be used to d