Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Tianshuai Guan"'
Dissertation/ Thesis
Autor:
Tianshuai Guan (10710258)
With the rapid development of information technology, network traffic is also increasing dramatically. However, many cyber-attack records are buried in this large amount of network trafficking. Therefore, many Intrusion Detection Systems (IDS) that c
Autor:
Tianshuai Guan
With the rapid development of information technology, network traffic is also increasing dramatically. However, many cyber-attack records are buried in this large amount of network trafficking. Therefore, many Intrusion Detection Systems (IDS) that c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::69b3dd17582b6e59c8a53216bc62a25b
Autor:
Chao Xu, Hewitt, Andy, Jingying Wang, Tianshuai Guan, Boltersdorf, Jonathan, Maggard, Paul A., Dougherty, Daniel B., Gundogdu, Kenan
Publikováno v:
Journal of Applied Physics; 2014, Vol. 116 Issue 4, p043519-1-043519-7, 7p, 1 Diagram, 5 Graphs
Autor:
Tianshuai Guan, J. E. Rowe, Harald Ade, Sean Stuart, Daniel B. Dougherty, Eliot Gann, Terry McAfee
Publikováno v:
Crystal Growth & Design. 14:4394-4401
Graphene has long been recognized as a potential replacement for indium tin oxide as a transparent conducting substrate that may not only be cheaper to manufacture but also may provide mechanical flexibility and templating for preferential organic fi
Autor:
Jingying Wang, Chao Xu, Kenan Gundogdu, Andrew Hewitt, Paul A. Maggard, Jonathan Boltersdorf, Tianshuai Guan, Daniel B. Dougherty
Publikováno v:
Journal of Applied Physics. 116:043519
The time evolution of electrostatic fields near a Bi2Se3 surface after a mechanical cleave was observed using Second Harmonic Generation. By comparing samples with different bulk doping levels and samples cleaved in different gas environments, these
Autor:
Chao Xu1, Hewitt, Andy1, Jingying Wang1, Tianshuai Guan1, Boltersdorf, Jonathan2, Maggard, Paul A.2, Dougherty, Daniel B.1 dbdoughe@ncsu.edu, Gundogdu, Kenan1 kgundog@ncsu.edu
Publikováno v:
Journal of Applied Physics. 2014, Vol. 116 Issue 4, p043519-1-043519-7. 7p. 1 Diagram, 5 Graphs.