Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Tianbao Zhai"'
Publikováno v:
Results in Physics, Vol 54, Iss , Pp 107146- (2023)
The precise measurement of the thickness of substrate and epitaxial layers in epi-wafers is essential in the semiconductor chip fabrication process. This study presents a new method for measuring the thickness of epi-wafers using Fourier Transform In
Externí odkaz:
https://doaj.org/article/9d90e1cf48f44952b916afe6f5ace7ce
Publikováno v:
IEEE Access, Vol 8, Pp 30928-30937 (2020)
For improving the efficiency, flexibility and robustness of yarn defect system, a new method is proposed to evaluate the quality of yarn by testing the yarn diameter, defects and hairiness based on machine vision and image processing technology. Firs
Externí odkaz:
https://doaj.org/article/408bec6c16e946fe8e3a114aca780f4c
Publikováno v:
IEEE Access, Vol 7, Pp 160345-160362 (2019)
In order to overcome the shortcomings of time-consuming and inefficient manual detection methods of fabric density, a fast and efficient automatic detection method of fabric density based on the digital grating is proposed. In order to realize automa
Externí odkaz:
https://doaj.org/article/30ae5e8e0c9a4761bee57a97c6899d08
Publikováno v:
24th National Laser Conference & Fifteenth National Conference on Laser Technology and Optoelectronics.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b6b63c5b869a28ee176c956f8ea61ef
https://doi.org/10.1117/12.2585186
https://doi.org/10.1117/12.2585186