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pro vyhledávání: '"Thryambak Chandilya"'
Publikováno v:
ECS Transactions. 44:1029-1035
The time to market of a digital device includes first silicon debug, yield ramp and mature yield improvement. Manufacturing test failures caused by defects during mature yield state are usually hard to characterize for advanced technologies and resem
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1eede660ca8c0fb32e8023f678a9419b
https://doi.org/10.1149/1.3694425
https://doi.org/10.1149/1.3694425
