Zobrazeno 1 - 10
of 48
pro vyhledávání: '"Thorsten Schultze"'
Autor:
Dilyan Damyanov, Tobias Kubiczek, Kevin Kolpatzeck, Andreas Czylwik, Thorsten Schultze, Jan C. Balzer
Publikováno v:
IEEE Access, Vol 11, Pp 9680-9690 (2023)
Terahertz time-domain spectroscopy (THz-TDS) is a promising tool for high-resolution 3D imaging of objects due to the high center frequency and bandwidth compared to microwave systems. In addition, terahertz waves have a higher penetration depth than
Externí odkaz:
https://doaj.org/article/9caad0db464c4792ad51229ec7f20643
Autor:
Samira Mansourzadeh, Dilyan Damyanov, Tim Vogel, Frank Wulf, Robert B. Kohlhaas, Bjorn Globisch, Thorsten Schultze, Martin Hoffmann, Jan C. Balzer, Clara J. Saraceno
Publikováno v:
IEEE Access, Vol 9, Pp 6268-6276 (2021)
The potential of pulsed THz radiation for time-of-flight imaging applications is well recognized. However, advances in this field are currently severely limited by the low average power of ultrafast THz sources. Typically, this results in impractical
Externí odkaz:
https://doaj.org/article/2155026bd23143eca69de97cc87ba4bb
Autor:
Aman Batra, Jan Barowski, Dilyan Damyanov, Michael Wiemeler, Ilona Rolfes, Thorsten Schultze, Jan C. Balzer, Diana Gohringer, Thomas Kaiser
Publikováno v:
IEEE Journal of Microwaves, Vol 1, Iss 2, Pp 574-585 (2021)
Synthetic aperture radar (SAR) is a well-known imaging technique and most commonly used up to the microwave frequency spectrum (below 30 GHz) which provides spatial resolution in the sub-m range. To enhance the resolution, higher frequency spectra su
Externí odkaz:
https://doaj.org/article/2314ef5d3a93402e8335875cc73b67f5
Autor:
Dilyan Damyanov, Aman Batra, Benedikt Friederich, Thomas Kaiser, Thorsten Schultze, Jan C. Balzer
Publikováno v:
IEEE Access, Vol 8, Pp 151997-152007 (2020)
Imaging in the terahertz frequency range has attracted growing interests since the first image of a leaf more than 20 years ago, due to its countless applications in basic and applied research, medical imaging, and nondestructive testing. However, mo
Externí odkaz:
https://doaj.org/article/af9edab5e6434b06afef522b3460f1df
Publikováno v:
IEEE Access, Vol 8, Pp 186138-186147 (2020)
Material characterization in the 0.1 - 10 THz range has been a major topic of research since its first demonstration 30 years ago. Advances in terahertz generation, detection, and data acquisition have contributed to improved bandwidth, signal power
Externí odkaz:
https://doaj.org/article/bd3ba9abed2446bca2d140cb9093c99a
Autor:
Dilyan Damyanov, Benedikt Friederich, Milad Yahyapour, Nico Vieweg, Anselm Deninger, Kevin Kolpatzeck, Xuan Liu, Andreas Czylwik, Thorsten Schultze, Ingolf Willms, Jan C. Balzer
Publikováno v:
IEEE Access, Vol 7, Pp 147704-147712 (2019)
In this paper, we propose a fast terahertz time-domain imaging method using a radar migration algorithm. We demonstrate high-resolution imaging in reflection without any collimating or focusing optics in the terahertz beam. In the proposed method, th
Externí odkaz:
https://doaj.org/article/c6cd1cd916ad4f47adf3f634a2397bbc
Publikováno v:
Journal of Electrical and Computer Engineering, Vol 2010 (2010)
By means of UWB Radar sensors the tasks of material characterisation and object recognition can be performed on the basis of a previous imaging of the whole environment. A UWB version of the microwave ellipsometry method is applied for estimating the
Externí odkaz:
https://doaj.org/article/8a2fb88b65854218917be734ce4fbb0f
Autor:
Martin Hoffmann, Björn Globisch, Thorsten Schultze, F. Wulf, Robert B. Kohlhaas, Dilyan Damyanov, Tim Vogel, Jan C. Balzer, S. Mansourzadeh, Clara J. Saraceno
Publikováno v:
IEEE Access, Vol 9, Pp 6268-6276 (2021)
The potential of pulsed THz radiation for time-of-flight imaging applications is well recognized. However, advances in this field are currently severely limited by the low average power of ultrafast THz sources. Typically, this results in impractical
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ebfd2d52276cacadad65d7ff0c2f0d35
https://ieeexplore.ieee.org/document/9312183/
https://ieeexplore.ieee.org/document/9312183/
