Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Thomas W. Krawczyk"'
Autor:
Todd Cooper, Samuel A. Steidl, Peter F. Curran, Thomas W. Krawczyk, Darren Walworth, Song Shang, David A. Rowe, Zuoding Wang, Craig A. Hornbuckle, Masashi Yamagata, Tony Liu, Cliff Duong, James R. Pulver
Publikováno v:
2010 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS).
A 4 by 28.3 to 10 by 11.32 Gb/s SFI-S compliant two chip SerDes for 100 Gb/s applications was fabricated using IBM's SiGe 130 nm 8HP process (210 GHz fT). The Multiplexer receives 10 channels, plus the SFI-S deskew channel at 11.32 Gb/s, and outputs
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e321be8593157373fe5ed7dea7764960
https://doi.org/10.1109/csics.2010.5619681
https://doi.org/10.1109/csics.2010.5619681
Autor:
Steven C. Aceto, Brandon Houghton, Adolfo O. Gutierrez, David Patti, Andrew Lundgren, Thomas W. Krawczyk, Michael Lienhard, Michelle D. Simkulet
Publikováno v:
SPIE Proceedings.
Using the MEMSPEC-2000TM prototype test station, several micromachined structures have been characterized. The MEMSPEC-2000TM test station employs a laser based non- contact measurement technique to determine the 3D profile of the test structure. Ver
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a94aca477ec2bd7a306430a5babbcf6a
https://doi.org/10.1117/12.360474
https://doi.org/10.1117/12.360474