Zobrazeno 1 - 10
of 41
pro vyhledávání: '"Thomas Signamarcheix"'
Autor:
Sebastien Sollier, Julie Widiez, Gweltaz Gaudin, Frederic Mazen, Thierry Baron, Mickail Martin, Marie-Christine Roure, Pascal Besson, Christophe Morales, Elodie Beche, Frank Fournel, Sylvie Favier, Amelie Salaun, Patrice Gergaud, Maryline Cordeau, Christellle Veytizou, Ludovic Ecarnot, Daniel Delprat, Ionut Radu, Thomas Signamarcheix
Publikováno v:
Journal of Low Power Electronics and Applications, Vol 6, Iss 4, p 19 (2016)
In this work, we demonstrate for the first time a 300-mm indium–gallium–arsenic (InGaAs) wafer on insulator (InGaAs-OI) substrates by splitting in an InP sacrificial layer. A 30-nm-thick InGaAs layer was successfully transferred using low tempera
Externí odkaz:
https://doaj.org/article/ffe38044688c423db103fb20f61af151
Autor:
Hughes Metras, Daniel Gitlin, Maud Vinet, Thomas Signamarcheix, Olivier Faynot, Jean-Rene Lequepeys, Severine Cheramy
Publikováno v:
2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S).
Electronic systems require the integration of tightly coupled components manufactured with very dissimilar manufacturing technologies. Meeting the system requirements of performance, cost and power is a challenging task and new integration methodolog
Wafer bonded four-junction GaInP/GaAs//GaInAsP/GaInAs concentrator solar cells with 44.7% efficiency
Autor:
Rainer Krause, Ulrich Fiedeler, T.N.D. Tibbits, A. Wekkeli, Thierry Salvetat, Michael Schachtner, Frank Dimroth, Paul Beutel, M. Piccin, Andreas W. Bett, Nicolas Blanc, Thomas Signamarcheix, Klaus Schwarzburg, Aurélie Tauzin, Eric Guiot, E. Oliva, Christian Karcher, Thomas Hannappel, Matthias Grave, Gerald Siefer, Anja Dobrich, Charlotte Drazek, Bruno Ghyselen
Publikováno v:
Progress in Photovoltaics: Research and Applications. 22:277-282
Triple-junction solar cells from III–V compound semiconductors have thus far delivered the highest solar-electric conversion efficiencies. Increasing the number of junctions generally offers the potential to reach even higher efficiencies, but mate
Autor:
Thomas Signamarcheix, Thomas Lacave, Gweltaz Gaudin, Mariam Sadaka, Lea Di Cioccio, Ionut Radu, Floriane Baudin
Publikováno v:
ECS Transactions. 58:17-28
3D integration aims at providing highly integrated systems by vertically stacking and connecting various materials, technologies, and functional components together. We will review the different approaches, using direct bonding, developed to address
Autor:
Mariolle Denis, Stephane Thieffry, Nicolas Chevalier, Ionut Radu, Bruno Imbert, Frederic Mazen, Thomas Signamarcheix, Floriane Baudin, Lea Di Cioccio, Angelique Mounier, Vincent Delaye, Gweltaz Gaudin, Thomas Lacave
Publikováno v:
ECS Transactions. 50:169-175
While significant research effort on various planar approaches, the 3D vertical IC stacking is undoubtedly gaining increasing momentum as a leading contender in the challenge to meet performance, cost, and size demands through this decade and beyond.
Autor:
Thierry Baron, Pascal Besson, Mickail Martin, Christophe Morales, Sebastien Sollier, Maryline Cordeau, Ionut Radu, Amelie Salaun, Thomas Signamarcheix, Ludovic Ecarnot, Marie-Christine Roure, Elodie Beche, Daniel Delprat, Christellle Veytizou, Gweltaz Gaudin, Sylvie Favier, Frank Fournel, Frédéric Mazen, Julie Widiez, Patrice Gergaud
Publikováno v:
Journal of Low Power Electronics and Applications; Volume 6; Issue 4; Pages: 19
Journal of Low Power Electronics and Applications, Vol 6, Iss 4, p 19 (2016)
Journal of Low Power Electronics and Applications, Vol 6, Iss 4, p 19 (2016)
In this work, we demonstrate for the first time a 300-mm indium–gallium–arsenic (InGaAs) wafer on insulator (InGaAs-OI) substrates by splitting in an InP sacrificial layer. A 30-nm-thick InGaAs layer was successfully transferred using low tempera
Autor:
L. Pasini, Perrine Batude, V. Benevent, Maud Vinet, Thomas Signamarcheix, R. Kachtouli, Sébastien Barnola, A. Royer, C. Vizioz, F. Fournel, J.M. Hartmann, G. Romano, N. Allouti, Sebastien Kerdiles, Christophe Morales, A. Seignard, C. Agraffeil, Frederic Boeuf, F. Ponthenier, Vincent Delaye, F. Deprat, M. Jourdan, L. Benaissa, L. Baud, C. Euvrard-Colnat, O. Faynot, Bernard Previtali, C. Guedj, P. Besombes, C. Comboroure, Claire Fenouillet-Beranger, L. Hortemel, Laurent Brunet, Claude Tabone, Nicolas Posseme, Alain Toffoli, C.-M. V. Lu, Christian Arvet, Pascal Besson
Publikováno v:
2016 IEEE Symposium on VLSI Technology.
For the first time, a full 3D CMOS over CMOS CoolCube™ integration is demonstrated with a top level compatible with state of the art high performance FDSOI (Fully-Depleted Silicon On Insulator) process requirements such as High-k/metal gate or rais
Autor:
V. Klinger, E. Oliva, Thierry Salvetat, Jean-Sébastien Moulet, Paul-Henri Haumesser, Christophe Lecouvey, Frank Dimroth, Romain Thibon, Thierry Mourier, Aurélie Tauzin, Thomas Signamarcheix, Paul Beutel, Guillaume Rodriguez, Jean-Marc Fabbri, Bruno Imbert, Frank Fournel, Abdelhak Hassaine, Christophe Jany
Publikováno v:
AIP Conference Proceedings.
The Solar cell front side is a key design point for improved cell efficiency as a trade is made between optical losses (shadowing effect) and electrical losses (resistance). One solution consists in frontside contacts report to the cell’s backside
Autor:
Gerald Siefer, Aurélie Tauzin, Andreas Bett, M. Niemeyer, Christian Karcher, Felix Predan, Frank Dimroth, T.N.D. Tibbits, Peter Fus-Kailuweit, E. Oliva, Thomas Signamarcheix, Rainer Krause, Paul Beutel, Jocelyne Wasselin, David Lackner, Eric Guiot, Charlotte Drazek
Publikováno v:
IEEE Journal of Photovoltaics
The highest solar cell conversion efficiencies are achieved with four-junction devices under concentrated sunlight illumination. Different cell architectures are under development, all targeting an ideal bandgap combination close to 1.9, 1.4, 1.0, an
Autor:
Olivier Faynot, Thomas Signamarcheix, Young-Ho Bae, A. Ohata, Laurent Clavelier, J. Widiez, Bruno Ghyselen, Sorin Cristoloveanu
Publikováno v:
Microelectronics Reliability. 52:2602-2608
Local Deep-Amorphization (DA) and subsequent Solid-Phase Epitaxial Regrowth (SPER) are envisioned for the co-integration of devices with hybrid surface orientation. The impact of these processes on the electrical characteristics of p-channel MOSFETs