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pro vyhledávání: '"Thomas Schmölzer"'
Autor:
Urs Gysin, Thilo Glatzel, Thomas Schmölzer, Adolf Schöner, Sergey Reshanov, Holger Bartolf, Ernst Meyer
Publikováno v:
Beilstein Journal of Nanotechnology, Vol 6, Iss 1, Pp 2485-2497 (2015)
Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices. However, the characterizat
Externí odkaz:
https://doaj.org/article/cd81f80cd77e46c4a0b5ba495abadf9e
Publikováno v:
International Journal of Materials Research. 100:1021-1030
The present paper summarizes our progress in establishing a novel production technology for -TiAl components to be used in advanced aircraft engines. In the beginning the main emphasis is put on the design of a -TiAl based alloy which exhibits excell
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2d30ce5c0ad3067cf002aead29c6bd3e
https://doi.org/10.3139/146.110154
https://doi.org/10.3139/146.110154