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pro vyhledávání: '"Thomas Ruggeri"'
Autor:
Joseph Crop, Evgeni Krimer, Nariman Moezzi-Madani, Robert Pawlowski, Thomas Ruggeri, Patrick Chiang, Mattan Erez
Publikováno v:
Journal of Low Power Electronics and Applications, Vol 1, Iss 3, Pp 334-356 (2011)
While Moore’s law scaling continues to double transistor density every technology generation, new design challenges are introduced. One of these challenges is variation, resulting in deviations in the behavior of transistors, most importantly in sw
Externí odkaz:
https://doaj.org/article/ea28a73c0d5a4698bd8efb6507566cb9
Autor:
Robert Pawlowski, Patrick Chiang, Nariman Moezzi-Madani, Joseph Crop, Mattan Erez, Thomas Ruggeri, Evgeni Krimer
Publikováno v:
Journal of Low Power Electronics and Applications, Vol 1, Iss 3, Pp 334-356 (2011)
Journal of Low Power Electronics and Applications
Volume 1
Issue 3
Pages 334-356
Journal of Low Power Electronics and Applications
Volume 1
Issue 3
Pages 334-356
While Moore’s law scaling continues to double transistor density every technology generation, new design challenges are introduced. One of these challenges is variation, resulting in deviations in the behavior of transistors, most importantly in sw