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Publikováno v:
Acta Crystallographica Section A Foundations of Crystallography. 55:855-863
In a large Czochralski-grown Si1−x Ge x (0.02 \leq x \leq 0.07) gradient crystal, diffraction patterns have been measured in symmetrical Laue geometry using synchrotron radiation in the energy range 100–200 keV. The experimental data are in very
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f9105ad96687f071ca4f81b8f8a23336
https://doi.org/10.1107/s010876739900313x
https://doi.org/10.1107/s010876739900313x
