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pro vyhledávání: '"Thomas M.-H. Wu"'
Autor:
Calvin Yi-Ping Chao, Thomas M.-H. Wu, Shang-Fu Yeh, Kuo-Yu Chou, Honyih Tu, Chih-Lin Lee, Chin Yin, Philippe Paillet, Vincent Goiffon
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 7, Pp 227-238 (2019)
The effects of X-ray irradiation on the random noises, especially the random telegraph noises (RTN), of a 45-nm on 65-nm stacked CMOS image sensor with 8.3M 1.1 μm pixels are investigated. It is found that before X-ray irradiation the dominant type
Externí odkaz:
https://doaj.org/article/772571bf7ee14c78833b91cda975e837
