Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Thomas M. Storey"'
Autor:
Thomas M. Storey, Bruce McWilliam
Publikováno v:
Journal of Electronic Testing. 10:109-118
Satellite and avionics applications represent an ideal application for the tremendous performance, cost, space, and reliability benefits of MCMs. These advantages are only realized, however, if accompanied by an efficient test strategy which verifies
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c8909ba9a3fe3ae8f784bbdf2b905593
https://doi.org/10.1023/a:1008230816838
https://doi.org/10.1023/a:1008230816838
Publikováno v:
2010 IEEE Aerospace Conference.
BAE Systems has developed a 4Mb Non-Volatile Chalcogenide Random Access Memory (C-RAM) optimized for the radiation environments encountered in spacecraft applications. C-RAM is a phase change memory with a unique combination of features that collecti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d76448c24506b03f49aed059ee1f0eb5
https://doi.org/10.1109/aero.2010.5446662
https://doi.org/10.1109/aero.2010.5446662
Autor:
John C. Rodgers, D. Lee, J. Maimon, Leonard R. Rockett, K.K. Hunt, Thomas M. Storey, M. Graziano
Publikováno v:
2008 9th Annual Non-Volatile Memory Technology Symposium (NVMTS).
BAE Systems, under contract to the US Air Force Research Labs, has been developing a 4Mb Non-Volatile Chalcogenide Random Access Memory (C-RAM?) optimized for the radiation environments encountered in spacecraft applications. C-RAM is a phase change
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c419e29ac9620d8701cbe445b8cd0378
https://doi.org/10.1109/nvmt.2008.4731183
https://doi.org/10.1109/nvmt.2008.4731183
Autor:
J. Stobie, Thomas M. Storey, K.K. Hunt, J. Maimon, Daniel Pirkl, John C. Rodgers, W. Neiderer, Adam Matthew Bumgarner, M. Graziano, L. Burcin, Bin Li, B. Orlowsky
Publikováno v:
2006 7th Annual Non-Volatile Memory Technology Symposium.
A 4 Mbit non-volatile chalcogenide-random access memory (C-RAMTM) has been designed and fabricated in RH 25, a radiation hardened CMOS technology. The top-down design focused on accommodating chalcogenide process variations and satisfying space syste
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d40a4fa0987c5d56894c7b02a552f3f5
https://doi.org/10.1109/nvmt.2006.378879
https://doi.org/10.1109/nvmt.2006.378879
Publikováno v:
Frontiers in Electronic Testing ISBN: 9781461377986
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::562a51b3b894b628a42974087caa9e31
https://doi.org/10.1007/978-1-4615-6107-1_10
https://doi.org/10.1007/978-1-4615-6107-1_10
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Conference
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