Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Thomas J Bzik"'
Autor:
Thomas J. Bzik
Publikováno v:
Wiley StatsRef: Statistics Reference
Calibration establishes and standardizes common units of measurement for commerce and scientific study. Through calibration the measured item or sample is related to items or samples with known properties, the standards. Statistical methods are typic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a5684fe79c7bc5c47d93aca4c96329ca
https://doi.org/10.1002/9781118445112.stat04149.pub2
https://doi.org/10.1002/9781118445112.stat04149.pub2
Publikováno v:
Quality Engineering. 23:212-216
In this article we continue to review standards published by ASTM International originating from Committee E11 on Quality and Statistics.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b7125c0a41a7b8b986a32f5c89d38e1
https://doi.org/10.1080/08982112.2011.557345
https://doi.org/10.1080/08982112.2011.557345
Autor:
Robert V. Brill, Thomas J. Bzik
Publikováno v:
Quality Engineering. 21:446-462
Trace contamination components often have distributions that are skewed to the right and show varying degrees of censoring. In order to meet customer requirements, control charts must account for these factors while maintaining a fixed type I error a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a700900d9bada897887f2d63d7e981fc
https://doi.org/10.1080/08982110903179051
https://doi.org/10.1080/08982110903179051
Autor:
Ketkar Sn, Thomas J. Bzik
Publikováno v:
Analytical Chemistry. 72:4762-4765
Failure to appropriately account for the nonconstant variance in the calibration data often leads to unreasonable estimates of calibration parameters. In this paper, we contrast the normal regression-based approach (ordinary least squares) as applied
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3e2a4fab7ed04c62161f3b3d7ca12fd6
https://doi.org/10.1021/ac000018s
https://doi.org/10.1021/ac000018s
Autor:
Thomas J. Bzik
Publikováno v:
Journal of the IEST. 40:29-33
The control of particulate contamination is integral to many semiconductor manufacturing processes. In these processes, particle contamination levels are measured and compared with performance standards and statistically analyzed to determine the pro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef13dea87ee303c6b1f01ca0ef8f0956
https://doi.org/10.17764/jiet.2.40.4.kp6l7l5286tl65qh
https://doi.org/10.17764/jiet.2.40.4.kp6l7l5286tl65qh
Publikováno v:
Analytical chemistry. 70(1)
The traditional method of estimating the weight of multiple objects is to obtain the weight of each object individually. We demonstrate that the precision and accuracy of these estimates can be improved by using a weighing scheme in which multiple ob
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e1ea026fb32bcfe34f7df90ae746b17d
https://pubmed.ncbi.nlm.nih.gov/21644600
https://pubmed.ncbi.nlm.nih.gov/21644600
Publikováno v:
Environmental Science & Technology. 25:878-883
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a9127358ff67fde187952700e1818f3a
https://doi.org/10.1021/es00017a008
https://doi.org/10.1021/es00017a008
Autor:
Thomas J. Bzik
Publikováno v:
Encyclopedia of Statistics in Quality and Reliability.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4bbfdd9a942eaca7690cd5606dadfb2e
https://doi.org/10.1002/9780470061572.eqr487
https://doi.org/10.1002/9780470061572.eqr487
Publikováno v:
SPIE Proceedings.
Linewidth roughness (LWR) is a major challenge for 90nm node and below. As feature sizes decrease, the reliable measurement, statistical comparison and interpretation of LWR data become increasingly important. The reliability of all LWR statistical a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3d19ad40773d46c298fa4e299bd3b669
https://doi.org/10.1117/12.599987
https://doi.org/10.1117/12.599987
Autor:
Thomas J Bzik
Publikováno v:
Technometrics. 46:489-490
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::efe8f254bbf0bdc7d73a5512fd5a7de1
https://doi.org/10.1198/tech.2004.s232
https://doi.org/10.1198/tech.2004.s232