Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Thomas Heidel"'
Autor:
Mario M. Pelella, JR Zhou, David Eppes, Mike Leary, Stephen Hale, Date Noorlag, Larry Bullard, Peter Huebler, Stefan Schuler, Andreas Dreizner, Jim Working, Darin Chan, Christoph Schwan, Manfred Horstmann, Bill En, Karsten Wieczorek, David Greenlaw, Thomas Heidel, Volker Heinig, John Miethke, Nick Kepler, Stephan Kruegel, Kai Frohberg, Jason Rivers, Thomas Heller, Ralf Richter, Norma Rodriguez, Rich Klein
Publikováno v:
2007 IEEE International SOI Conference.
A new device structure to mitigate plasma charging damage in advanced SOI technologies has been demonstrated that can be easily incorporated into modern-day, as well as future-scaled microprocessor designs. This novel structure offers improved produc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b03dfb978a7a34245474febbdb674f5
https://doi.org/10.1109/soi.2007.4357860
https://doi.org/10.1109/soi.2007.4357860
Autor:
Chris Thomale
Publikováno v:
University of Vienna-u:cris
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::5af614795a4298f523ae264e3ccb087b
https://hdl.handle.net/11590/431670
https://hdl.handle.net/11590/431670
