Zobrazeno 1 - 10
of 199
pro vyhledávání: '"Thomas Höche"'
Autor:
Gregor J. Hoerder, Markus Seibald, Dominik Baumann, Thorsten Schröder, Simon Peschke, Philipp C. Schmid, Tobias Tyborski, Philipp Pust, Ion Stoll, Michael Bergler, Christian Patzig, Stephan Reißaus, Michael Krause, Lutz Berthold, Thomas Höche, Dirk Johrendt, Hubert Huppertz
Publikováno v:
Nature Communications, Vol 10, Iss 1, Pp 1-9 (2019)
Developing innovative materials for reduced energy consumption in phosphor converted white light-emitting diodes remains a challenge. Here, the authors report a narrow band red-emitting oxonitride material with a highly symmetrical Sr2 + coordination
Externí odkaz:
https://doaj.org/article/60dd6c4698a44eb3b6c4169538142be9
Autor:
Abbas Saeed Hakeem, Sharafat Ali, Thomas Höche, Qasem Ahmed Drmosh, Amir Azam Khan, Bo Jonson
Publikováno v:
Nanomaterials, Vol 11, Iss 8, p 1896 (2021)
Oxynitride glasses are not yet commercialised primarily due to the impurities present in the network of these glasses. In this work, we investigated the microstructure and instinctive defects in nitrogen rich La−Si−O−N glasses. Glasses were pre
Externí odkaz:
https://doaj.org/article/c4a5530d65b64658a2a3460c3a18307e
Autor:
Enrico Kleebusch, Christian Patzig, Michael Krause, Yongfeng Hu, Thomas Höche, Christian Rüssel
Publikováno v:
Scientific Reports, Vol 7, Iss 1, Pp 1-12 (2017)
Abstract The high economic importance of glass ceramics based on Li2O/Al2O3/SiO2 (LAS) is mainly due to their low coefficients of thermal expansion (CTE), which make these materials suitable candidates for a number of applications. The exact mechanis
Externí odkaz:
https://doaj.org/article/306c9c4614e24a4aa6a812e3a3638f50
Autor:
Stefan Hohenberger, Johanna K. Jochum, Margriet J. Van Bael, Kristiaan Temst, Christian Patzig, Thomas Höche, Marius Grundmann, Michael Lorenz
Publikováno v:
Materials, Vol 13, Iss 1, p 197 (2020)
Combining various (multi-)ferroic materials into heterostructures is a promising route to enhance their inherent properties, such as the magnetoelectric coupling in BiFeO3 thin films. We have previously reported on the up-to-tenfold increase of the m
Externí odkaz:
https://doaj.org/article/8ee6dbd7555e4f32a66659e5464bbdcb
Autor:
Adel Kalache, Anastasios Markou, Susanne Selle, Thomas Höche, Roshnee Sahoo, Gerhard H. Fecher, Claudia Felser
Publikováno v:
APL Materials, Vol 5, Iss 9, Pp 096102-096102-9 (2017)
This work reports on the structural and magnetic properties of Mn2.7−xFexGa1.3 Heusler films with different Fe content x (0 ≤ x ≤ 1.2). The films were deposited heteroepitaxially on MgO single crystal substrates, by magnetron sputtering. Mn2.7
Externí odkaz:
https://doaj.org/article/e765e2f873fb484b88d6606d006874f5
Autor:
Adel Kalache, Guido Kreiner, Siham Ouardi, Susanne Selle, Christian Patzig, Thomas Höche, Claudia Felser
Publikováno v:
APL Materials, Vol 4, Iss 8, Pp 086113-086113-8 (2016)
Nanostructured Mn3Ge ribbons with a composition ranging from 77 to 74 at.% Mn were prepared using induction melting, melt-spinning, and subsequent heat treatment. The hard magnetic properties of the ribbons originate from the highly anisotropic tetra
Externí odkaz:
https://doaj.org/article/937746c85ee846d394b447d03bcc312b
Publikováno v:
ARKIVOC, Vol 2011, Iss 4, Pp 54-70 (2011)
Externí odkaz:
https://doaj.org/article/b218a9a7d64c4f44bfd85e51d2650b43
Autor:
Martin Steglich, Christian Patzig, Lutz Berthold, Frank Schrempel, Kevin Füchsel, Thomas Höche, Ernst-Bernhard Kley, Andreas Tünnermann
Publikováno v:
AIP Advances, Vol 3, Iss 7, Pp 072108-072108 (2013)
The growth of Ge on Si(100) by DC Magnetron Sputtering at various temperatures is studied by Spectroscopic Ellipsometry and Transmission Electron Microscopy. Smooth heteroepitaxial Ge films are prepared at relatively low temperatures of 380°C. Typic
Externí odkaz:
https://doaj.org/article/215bfc868e7b411ab5272532c15e96eb
Publikováno v:
Ceramics International. 49:21246-21254
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::18afa42206d1d060c0236fafd053a0a8
https://doi.org/10.1016/j.ceramint.2023.03.254
https://doi.org/10.1016/j.ceramint.2023.03.254
Publikováno v:
Journal of Microscopy. 289:20-31
X-ray-computed tomography with sub-micron resolution (nano-CT) is one of the most useful techniques to examine the 3D microstructure of materials down to voxel sizes 10 nm. However, since size and shape of samples have considerable influence on acqui
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fa170d1737fc9764e9b9fab15303657f
https://doi.org/10.1111/jmi.13147
https://doi.org/10.1111/jmi.13147