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Shock testing was performed on a selected commercial-off-the-shelf - MicroElectroMechanical System (COTS-MEMS) accelerometer to determine the margin between the published absolute maximum rating for shock and the 'measured' level where failures are o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a5a244e5bc0bf17c6024fd90f157c620
https://doi.org/10.2172/1028884
https://doi.org/10.2172/1028884
Autor:
Paul G. Kotula, Sean J. Hearne, Stephen M. Foiles, David M. Follstaedt, Thomas Edward Buchheit, Christopher W. Dyck, Maarten P. de Boer
The ability to integrate metal and semiconductor micro-systems to perform highly complex functions, such as RF-MEMS, will depend on developing freestanding metal structures that offer improved conductivity, reflectivity, and mechanical properties. Th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2453f55b65e8ea88100fa262b7a5223a
https://doi.org/10.2172/876252
https://doi.org/10.2172/876252