Zobrazeno 1 - 10
of 69
pro vyhledávání: '"Thomas E. Buchheit"'
Publikováno v:
Journal of Intelligent Material Systems and Structures. 34:393-400
Alloying NiTi shape memory alloys with sufficient Pt and Pd at the expense of Ni has been shown to increase transformation temperatures well above those possible with the binary composition, enabling consideration of a new class of high-temperature m
Autor:
Arun Ganesh, Thomas E. Buchheit
Publikováno v:
Hospitalized Chronic Pain Patient ISBN: 9783031083754
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ce9af6efc1d5b7d616eb49e94e60e39
https://doi.org/10.1007/978-3-031-08376-1_45
https://doi.org/10.1007/978-3-031-08376-1_45
Publikováno v:
2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Measurements performed on a population of electronic devices reveal part-to-part variation due to manufacturing process variation. Corner models are a useful tool for the designers to bound the effect of this variation on circuit performance. To accu
Autor:
Hojun Lim, Lisa Anne Deibler, Corbett Chandler. Battaile, Rémi Dingreville, Thomas E. Buchheit
Publikováno v:
Computational Materials Science. 117:437-444
In this work, a crystal plasticity-finite element (CP-FE) model is used to investigate the effects of microstructural variability at a notch tip in tantalum single crystals and polycrystals. It is shown that at the macroscopic scale, the mechanical r
Autor:
Ronald D. Noebe, Thomas E. Buchheit, Donald Francis Susan, Jordan E. Massad, James R. McElhanon
Publikováno v:
Metallurgical and Materials Transactions A. 47:1587-1599
A series of Ti-rich Ni-Ti-Pt ternary alloys with 13 to 18 at. pct Pt were processed by vacuum arc melting and characterized for their transformation behavior to identify shape memory alloys (SMA) that undergo transformation between 448 K and 498 K (1
Autor:
Paiboon Tangyunyong, Joshua Beutler, Biliana S. Paskaleva, Edward I. Cole, Guillermo M. Loubriel, Thomas E. Buchheit, Darlene M. Udoni
Publikováno v:
International Symposium for Testing and Failure Analysis.
We present a new, non-destructive electrical technique, Power Spectrum Analysis (PSA). PSA as described here uses off-normal biasing, an unconventional way of powering microelectronics devices. PSA with off-normal biasing can be used to detect subtle
Autor:
Jay Carroll, Corbett Chandler. Battaile, Brad L. Boyce, Christopher R. Weinberger, Hojun Lim, Thomas E. Buchheit
Publikováno v:
International Journal of Plasticity. 60:1-18
In this work, the grain-scale elastoplastic deformation behavior of coarse-grained body centered cubic (BCC) tantalum was simulated using a crystal plasticity finite element method (CP-FEM) and compared to experimental measurements of intragranular s