Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Thomas Benoist"'
Autor:
Fabio Tommasini, Thomas Benoist, Soichi Shibuya, Maximillian N.J. Woodall, Eleonora Naldi, Jessica C. Orr, Giovanni Giuseppe Giobbe, Elizabeth F. Maughan, Robert E. Hynds, Asllan Gjinovci, J. Ciaran Hutchinson, Owen J. Arthurs, Sam M. Janes, Nicola Elvassore, Claire M. Smith, Federica Michielin, Alessandro Filippo Pellegata, Paolo De Coppi
Lung infections are one of the leading causes of death worldwide, and this situation has been exacerbated by the emergence of COVID-19. Pre-clinical modelling of viral infections has relied on cell cultures that lack 3D structure and the context of l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::213bf01746839c8b9f7c49a9173784bd
https://doi.org/10.1101/2023.02.01.526441
https://doi.org/10.1101/2023.02.01.526441
Autor:
Patrizia Romani, Nunzia Nirchio, Mattia Arboit, Vito Barbieri, Anna Tosi, Federica Michielin, Soichi Shibuya, Thomas Benoist, Danchen Wu, Charles Colin Thomas Hindmarch, Monica Giomo, Anna Urciuolo, Flavia Giamogante, Antonella Roveri, Probir Chakravarty, Marco Montagner, Tito Calì, Nicola Elvassore, Stephen L. Archer, Paolo De Coppi, Antonio Rosato, Graziano Martello, Sirio Dupont
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6176b972b22ad10e69d7f31e40a7fc86
http://hdl.handle.net/11577/3414259
http://hdl.handle.net/11577/3414259
Autor:
Sebastien Bernard, Thomas Benoist, Ivan Miro-Panades, Bastien Giraud, Edith Beigne, Yvain Thonnart, Robin Wilson, O. Billoint, Jean-Philippe Noel, Anuj Grover, Olivier Thomas, Fady Abouzeid, Julien Le Coz, Sylvain Clerc, Alexandre Valentian, Philippe Flatresse, Christian Bernard
Publikováno v:
IEEE Journal of Solid-State Circuits. 50:125-136
Wide voltage range operation for DSPs brings more versatility to achieve high energy efficiency in mobile applications. This paper describes a 32 bits DSP fabricated in 28 nm Ultra Thin Body and Box FDSOI technology. Body Biasing Voltage (VBB) scalin
Autor:
Thomas Benoist, D. Marin-Cudraz, Pierre Perreau, Olivier Faynot, Sorin Cristoloveanu, Christel Buj, P. Gentil, Philippe Galy, Claire Fenouillet-Beranger
Publikováno v:
Microelectronic Engineering. 88:1276-1279
In this article, the impact in FDSOI technology, of ground plane and buried oxide (BOX) size on the robustness and on the NMOS triggering voltage (Vt1) is shown. We show experimentally that firstly thin BOX devices are more robust than thick BOX devi
Autor:
Fabien Clermidy, Thomas Benoist, Robin Wilson, Bastien Giraud, Alexandre Valentian, Bertrand Pelloux-Prayer, Olivier P. Thomas, Sylvain Clerc, Julien Le Coz, Ivan Miro Panades, Jean-Philippe Noel, Christian Bernard, David Turgis, O. Billoint, Fady Abouzeid, Anuj Grover, Edith Beigne, Philippe Flatresse, Philippe Magarshack, Yvain Thonnart, Philippe Roche, Sebastien Bernard
Publikováno v:
ISSCC
Wide-voltage-range-operation DSPs bring more versatility to achieve high energy efficiency in mobile applications to increase signal processing complexity and handle a large range of performance specifications. This paper describes a 32b DSP fabricat
Publikováno v:
2013 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S).
This paper focuses on the design of SRAM row decoder for modern portable devices, in 28nm Ultra-Thin Body and Buried oxide (UTBB) Fully-Depleted SOI (FDSOI) technology. The proposed Mixed Single Well (Mixed-SW) design concept enables a major speed im