Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Thomas Druga"'
Autor:
Anna Sinterhauf, Philip Willke, Hans Hofsäss, Kalobaran Maiti, Martin Wenderoth, Sangeeta Thakur, Steffen Weikert, J. Amani, Thomas Druga, Thomas Kotzott
Publikováno v:
Nano letters. 15(8)
We investigate the structural, electronic, and transport properties of substitutional defects in SiC-graphene by means of scanning tunneling microscopy and magnetotransport experiments. Using ion incorporation via ultralow energy ion implantation, th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cc35520094d40617b937495180bb5cd1
https://pubmed.ncbi.nlm.nih.gov/26120803
https://pubmed.ncbi.nlm.nih.gov/26120803
Publikováno v:
Nature communications. 6
Electronic transport on a macroscopic scale is described by spatially averaged electric fields and scattering processes summarized in a reduced electron mobility. That this does not capture electronic transport on the atomic scale was realized by Lan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::30672a5d65492aefd63857a0407d757b
https://pubmed.ncbi.nlm.nih.gov/25744816
https://pubmed.ncbi.nlm.nih.gov/25744816
Publikováno v:
Physical Review B. 76
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a6d742ddef33ec6c96650dae2b55cb59
https://doi.org/10.1103/physrevb.76.193407
https://doi.org/10.1103/physrevb.76.193407
Autor:
Thomas Druga, Hans Hofsäss, Philip Willke, Kalobaran Maiti, S. Weikert, Martin Wenderoth, J. Amani, Sangeeta Thakur
Publikováno v:
Applied Physics Letters. 105:111605
We perform a structural analysis of nitrogen-doped graphene on SiC(0001) prepared by ultra low-energy ion bombardment. Using scanning tunneling microscopy, we show that nitrogen atoms are incorporated almost exclusively as graphitic substitution in t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::63a36564817f867665ec12fbe48fd1d0
https://doi.org/10.1063/1.4895801
https://doi.org/10.1063/1.4895801
Publikováno v:
Applied Physics Letters. 103:051601
We present Kelvin probe force microscopy measurements and resistance network simulations of the lateral charge transport across few-layer graphene on the semi-insulating 6H-SiC(0001) surface. After preparation of the SiC crystal by thermal decomposit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f45ef8e3c618d09d9f1e4aa339e3c0a1
https://doi.org/10.1063/1.4816955
https://doi.org/10.1063/1.4816955
Autor:
Philip Willke, JulianA. Amani, Anna Sinterhauf, Sangeeta Thakur, Thomas Kotzott, Thomas Druga, Steffen Weikert, Kalobaran Maiti, Hans Hofsäss, Martin Wenderoth
Publikováno v:
Nano Letters; Aug2015, Vol. 15 Issue 8, p5110-5115, 6p