Two-step procedure for trace element analysis in food via calibration-free laser-induced breakdown spectroscopy

Autor: Thierry Sarnet, Chia-Ting Chen, Daniela Bănaru, Jӧrg Hermann

Publikováno v: Spectrochimica Acta Part B: Atomic Spectroscopy
Spectrochimica Acta Part B: Atomic Spectroscopy, 2018, 150, pp.77-85. ⟨10.1016/j.sab.2018.10.011⟩
Spectrochimica Acta Part B: Atomic Spectroscopy, Elsevier, 2018, 150, pp.77-85. ⟨10.1016/j.sab.2018.10.011⟩

International audience; Elemental analyses via calibration-free laser-induced breakdown spectroscopy (LIBS) usually suffer low sensitivity due to continuum emission generated by the plasma in local thermodynamic equilibrium. Here we propose a two-ste

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8794563d14d2a94ca2409e0c9b290dd8
https://doi.org/10.1016/j.sab.2018.10.011

Laser engraving optimization for achieving smooth sidewalls

Autor: A. Sikora, Thierry Sarnet, Gaëlle Coustillier, Marc Sentis

Publikováno v: Applied Surface Science
Applied Surface Science, Elsevier, 2019, ⟨10.1016/j.apsusc.2019.06.234⟩
Applied Surface Science, 2019, ⟨10.1016/j.apsusc.2019.06.234⟩

International audience; The surface roughness of picosecond laser micromachined sidewalls in silicon is investigated 16 theoretically and experimentally by varying the laser fluence, the focal spot size and the crater overlap. 17 It is shown that the

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::08b4233eec29e1a8cc70477f004a3338
https://hal.archives-ouvertes.fr/hal-02165681

Optimization of picosecond laser processing for microscopy sample preparation prior to Ion milling polishing

Autor: Marc Sentis, A. Sikora, Thierry Sarnet, Jérôme Adrian, V. Goubier, A. Delobbe, L. Fares, A. Corbin

Publikováno v: 2017 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC).

Microchips are more and more complex and designed in thick 3 dimensional packages. In order to access and characterize by electron microscopy (SEM and TEM) any detected defect responsible for malfunction of the device, a large quantity of matter need

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::4b0d41796a77cbce379a03265e426def
https://doi.org/10.1109/cleoe-eqec.2017.8087286

Micro and nano-structuration of silicon by femtosecond laser: Application to silicon photovoltaic cells fabrication

Autor: S. Martinuzzi, I. Perichaud, V. Vervisch, Marc Sentis, Ph. Delaporte, H. Etienne, Thierry Sarnet, Mathieu Halbwax, Frank Torregrosa

Publikováno v: Thin Solid Films
Thin Solid Films, 2008, 516, pp.6791-6795. ⟨10.1016/j.tsf.2007.12.117⟩
Thin Solid Films, Elsevier, 2008, 516 (20), pp.6791-6795
Thin Solid Films, 2008, 516 (20), pp.6791-6795
Thin Solid Films, Elsevier, 2008, 516, pp.6791-6795. ⟨10.1016/j.tsf.2007.12.117⟩

We have prepared absorbing structures for photovoltaic cells with different nanotexturization, obtained by means of a femtosecond laser, without the use of corrosive gas (under vacuum). To take in account the 3D structured front surface, the emitter

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a25ffb42cbb1cda6fa2e5ea49bb6c2f0
https://doi.org/10.1016/j.tsf.2007.12.117

Laser doping for microelectronics and microtechnology

Autor: Dominique Débarre, G. Kerrien, Jacques Boulmer, Kuniyuki Kakushima, C. Laviron, M. Hernandez, Thierry Sarnet, Alain Bosseboeuf, Nourdin Yaakoubi, Elisabeth Dufour-Gergam, Tarik Bourouina, J. Venturini

Publikováno v: Applied Surface Science. 247:537-544

The future CMOS generations for microelectronics will require advanced doping techniques capable to realize ultra-shallow, highly-doped junctions with abrupt profiles. Recent experiments have shown the potential capabilities of laser processing of Ul

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e67293178df8972e00aeb0c363080f8c
https://doi.org/10.1016/j.apsusc.2005.01.172