Reducing Rollback Cost in VLSI Circuits to Improve Fault Tolerance

Autor: Thierry Bonnoit, Michael Nicolaidis, Nacer-Eddine Zergainoh

Publikováno v: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE, 2018, 26 (8), pp.1438-1451. ⟨10.1109/TVLSI.2018.2818021⟩

International audience; In nanometer technologies, circuits are more and more sensitive to various kinds of perturbations. Alpha particles and atmospheric neutrons induce single-event upsets, affecting memory cells, latches, and flip-flops. They also

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9bbce57af895082af99d16df23babf59
https://doi.org/10.1109/tvlsi.2018.2818021

SEU Impact in Processor's Control-Unit: Preliminary Results Obtained for LEON3 Soft-Core

Autor: Nacer-Eddine Zergainoh, Alexandre Siqueira Guedes Coelho, Raoul Velazco, Thierry Bonnoit

Publikováno v: 18th IEEE Latin American Test Symposium (LATS’17)
18th IEEE Latin American Test Symposium (LATS’17), Mar 2017, Bogota, Colombia. pp.1-4
LATS

International audience; The miniaturization issues from the advanced integrated circuit manufacturing technologies lead to increase the probabilities of single node upset and multiple upsets errors of neighbor nodes. The study of such conjecture is m

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8c7365dc4827c5fa07c3350d52e305d4
https://hal.archives-ouvertes.fr/hal-01523901

Robust BER estimator for DBPSK modulation

Autor: Thierry Bonnoit, Emeric de Foucauld, Cedric Dehos, Dominique Morche

Publikováno v: NEWCAS

Fast industrial test of RF circuits is today a main challenge issue with current wireless standards. As the impact of the test on the overall product cost is no longer negligible, there is a strong motivation in simplifying the test. With the emergen

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::1f6bbc9f706080d0b17fc5e7d57831c1
https://doi.org/10.1109/newcas.2014.6934006

Towards a Tool for Implementing Delay-Free ECC in Embedded Memories

Autor: Michael Nicolaidis, Thierry Bonnoit, Nacer-Eddine Zergainoh

Publikováno v: Proc. of IEEE International Conference on Computer Design (ICCD'11)
IEEE International Conference on Computer Design (ICCD'11)
IEEE International Conference on Computer Design (ICCD'11), Oct 2011, Amherst, Ma., United States. pp.441-442, ⟨10.1109/ICCD.2011.6081440⟩
ICCD

ISBN 978-1-4577-1953-0; International audience; The reliability of modern Integrated Circuits is affected by nanometric scaling. In many modern designs embedded memories occupy the largest part of the die and are designed as tight as allowed by the p

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fd4cb9967c02985789de0df1567c04ba
https://hal.archives-ouvertes.fr/hal-00671337