Zobrazeno 1 - 10
of 103
pro vyhledávání: '"Thielsch, R."'
Autor:
Mobius, A., Frenzel, C., Thielsch, R., Rosenbaum, R., Adkins, C. J., Schreiber, M., Bauer, H. -D., Grotzschel, R., Hoffmann, V., Krieg, T., Matz, N., Vinzelberg, H., Witcomb, M.
Publikováno v:
Phys. Rev. B 60, 14209 (1999)
We study the metal-insulator transition in two sets of amorphous Si_{1-x}Ni_x films. The sets were prepared by different, electron-beam-evaporation-based technologies: evaporation of the alloy, and gradient deposition from separate Ni and Si crucible
Externí odkaz:
http://arxiv.org/abs/cond-mat/9812106
Autor:
Schönberger, Waldemar, Gerlach, Gerald, Fahland, Matthias, Munzert, Peter, Schulz, Ulrike, Thielsch, R., Kleinhempel, R.
Publikováno v:
In Surface & Coatings Technology 25 July 2011 205 Supplement 2:S495-S497
Publikováno v:
In Thin Solid Films 2002 410(1):86-93
Publikováno v:
In Journal of Electron Spectroscopy and Related Phenomena 1999 104(1):161-171
Fluorescence experiments have been performed to study the interaction of 193 nm laser radiation with dielectric thin films of LaF3, AlF3, and MgF2. Spectral and time resolved measurements reveal the presence of cerium in LaF3 and the influence of hyd
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::c25b11de92558e5523999d68bf3334e7
https://publica.fraunhofer.de/handle/publica/202570
https://publica.fraunhofer.de/handle/publica/202570
Time resolved luminescence experiments have been set up in order to study the interaction of 193 nm laser radiation with dielectric thin films. At room temperature, Al2O3 coatings show photoluminescence upon ArF excimer laser irradiation with signifi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::b33dc0167b82eec2823968bfa6c6933a
https://publica.fraunhofer.de/handle/publica/202571
https://publica.fraunhofer.de/handle/publica/202571
We study the metal-insulator transition in two sets of amorphous Sil-x Nix films. The sets were prepared by different, electron-beam-evaporation- based technologies: evaporation of the alloy, and gradient deposition from separate Ni and Si crucibles.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::8ce0c747b4ffb0ccacaf35c0504ee1cc
https://publica.fraunhofer.de/handle/publica/194752
https://publica.fraunhofer.de/handle/publica/194752
At the performance of depth profiling by glow discharge optical emission spectroscopy (GD-OES) the intensities of optical emission lines of sample and sputter gas elements are measured in depen-dence on the time of sputtering. Radio-frequency (rf) sp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::04b926173141fad4b772ff235a7ee0a1
https://publica.fraunhofer.de/handle/publica/194691
https://publica.fraunhofer.de/handle/publica/194691
Recent developments of DUV~excimer laser applications have demanded for radiation resistant coated components at excimer laser wavelengths in the ultraviolet spectral region. To meet the requirements of long term reliability and high pulse number thr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::61c50b481b794b49990daef056ba1376
https://publica.fraunhofer.de/handle/publica/194692
https://publica.fraunhofer.de/handle/publica/194692
PbS nanocrystal-doped SiO2 glass thin films and a single evaporated PbS film were studied by X-ray photoelectron spectroscopy (XPS) and factor analysis (FA). The composite films contained PbS crystallites with mean dimensions as small ELS for vibrati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______610::ef5114e40049e9d86047cfce93da8220
https://publica.fraunhofer.de/handle/publica/195081
https://publica.fraunhofer.de/handle/publica/195081