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pro vyhledávání: '"Thibaud Delobelle"'
Autor:
Gilles Sassatelli, Sophiane Senni, Lionel Torres, Pascal Benoit, Pierre-Yves Péneau, Odilia Coi, Abdoulaye Gamatié, Thibaud Delobelle
Publikováno v:
IEEE DATE 2017 Conference
20th Conference & Exhibition of Design, Automation & Test in Europe
DATE: Design, Automation and Test in Europe
DATE: Design, Automation and Test in Europe, Mar 2017, Lausanne, Switzerland. pp.536-541, ⟨10.23919/DATE.2017.7927046⟩
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017
DATE
20th Conference & Exhibition of Design, Automation & Test in Europe
DATE: Design, Automation and Test in Europe
DATE: Design, Automation and Test in Europe, Mar 2017, Lausanne, Switzerland. pp.536-541, ⟨10.23919/DATE.2017.7927046⟩
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017
DATE
International audience; The scaling limits of CMOS have pushed many researchers to explore alternative technologies for beyond CMOS circuits. In addition to the increased device variability and process complexity led by the continuous decreasing size
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4aa8d9455e0f8897d7ee53780840af31
