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Autor:
Blake Bleem, Jordan Renaud, Thi T Tuyen Nguyen, Srija Bandyopadhayay, Asit Bandyopadhayay, Reshmi Mitra
Publikováno v:
2021 IEEE Applied Imagery Pattern Recognition Workshop (AIPR).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::212744647d5ca83c0680ce125e7c206b
https://doi.org/10.1109/aipr52630.2021.9762205
https://doi.org/10.1109/aipr52630.2021.9762205
