Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Theresa Grünleitner"'
Autor:
Alex Henning, Sergej Levashov, Chenjiang Qian, Theresa Grünleitner, Julian Primbs, Jonathan J. Finley, Ian D. Sharp
Publikováno v:
Advanced Materials Interfaces, Vol 10, Iss 15, Pp n/a-n/a (2023)
Abstract Here, it is shown that in situ spectroscopic ellipsometry (SE) is a powerful method for probing the effects of reactant adsorption and film formation on the excitonic properties of 2D materials during atomic layer deposition (ALD), thus allo
Externí odkaz:
https://doaj.org/article/dcd30273361f4eaabcabccb508120011
Autor:
Alex Henning, Johannes D. Bartl, Lukas Wolz, Maximilian Christis, Felix Rauh, Michele Bissolo, Theresa Grünleitner, Johanna Eichhorn, Patrick Zeller, Matteo Amati, Luca Gregoratti, Jonathan J. Finley, Bernhard Rieger, Martin Stutzmann, Ian D. Sharp
Publikováno v:
Advanced Materials Interfaces, Vol 10, Iss 6, Pp n/a-n/a (2023)
Abstract Atomic layer deposition (ALD) is a key technique for the continued scaling of semiconductor devices, which increasingly relies on scalable processes for interface manipulation of structured surfaces on the atomic level. While ALD allows the
Externí odkaz:
https://doaj.org/article/63c8b30326a043ad9591dcf50f6b1397
Autor:
Theresa Grünleitner, Alex Henning, Michele Bissolo, Marisa Zengerle, Luca Gregoratti, Matteo Amati, Patrick Zeller, Johanna Eichhorn, Andreas V. Stier, Alexander W. Holleitner, Jonathan J. Finley, Ian D. Sharp
Publikováno v:
ACS Nano. 16:20364-20375
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1022c15b2cf240e70ff52a8d2b9e9ef6
https://doi.org/10.1021/acsnano.2c06317
https://doi.org/10.1021/acsnano.2c06317
Autor:
Andreas V. Stier, Zhutong Jiang, Alexander W. Koch, Michael H. Köhler, Ali K. Yetisen, Jie Dong, Theresa Grünleitner, Martin Jakobi, Hongwei Li, Ian D. Sharp, Jonathan J. Finley, Bjoern H. Menze, Xingchen Dong, Kun Wang, İnci Güler
Layered, two-dimensional (2D) materials are promising for next-generation photonics devices. Typically, the thickness of mechanically cleaved flakes and chemical vapor deposited thin films is distributed randomly over a large area, where accurate ide
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6f4eb58ef285396735b8967a91dee946
https://www.zora.uzh.ch/id/eprint/198428/
https://www.zora.uzh.ch/id/eprint/198428/
Autor:
Theresa Grünleitner, Alex Henning, Michele Bissolo, Armin Kleibert, Carlos A.F. Vaz, Andreas V. Stier, Jonathan J. Finley, Ian D. Sharp
Publikováno v:
Advanced Functional Materials. 32:2270119
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::31ec1cf4af5ce4cb4cbb6b31c227ee4e
https://doi.org/10.1002/adfm.202270119
https://doi.org/10.1002/adfm.202270119