Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Theodore Manikas"'
Publikováno v:
Journal of Electronic Testing.
Test sets that target standard fault models may not always be sufficient for detecting all defects. To evaluate test sets for the detection of unmodeled defects, n-detect test sets (which detect all modeled faults at least n times) have previously be
Publikováno v:
2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS).
Autor:
Aviraj Sinha, Michael Taylor, Nathan Srirama, Theodore Manikas, Eric C. Larson, Mitchell A. Thornton
Publikováno v:
2021 IEEE Conference on Control Technology and Applications (CCTA).
Autor:
Theodore Manikas
Publikováno v:
International Journal of Robotics and Automation. 24
Publikováno v:
ECS Meeting Abstracts. :83-83
not Available.