Zobrazeno 1 - 10
of 15
pro vyhledávání: '"Theis, C. D."'
Autor:
Schlom, D. G., Haenit, J. H., Theis, C. D., Tian, W., Pan, X. Q., Brown, G. W., Hawley, M. E.
Publikováno v:
MRS Online Proceedings Library; Dec2000, Vol. 619 Issue 1, p105-114, 10p
Publikováno v:
MRS Online Proceedings Library; 1997, Vol. 474 Issue 1, p297-302, 6p
Autor:
Theis, C. D., Schlom, D. G.
Publikováno v:
Journal of Materials Research; 05/01/1997, Vol. 12 Issue 5, p1297-1305, 9p
Publikováno v:
Materials Science and Engineering B: Solid-State Materials for Advanced Technology; 2001, Vol. 87 Issue: 3 p282-291, 10p
Publikováno v:
Applied Physics Letters; 9/22/2003, Vol. 83 Issue 12, p2315, 3p, 4 Diagrams
Autor:
Theis, C. D., Schlom, D. G.
Publikováno v:
Journal of Crystal Growth; 1997, Vol. 174 Issue: 1 p473-479, 7p
Publikováno v:
Thin Solid Films; 1998, Vol. 325 Issue: 1 p107-114, 8p
Autor:
Haeni, J. H., Theis, C. D., Schlom, D. G., Tian, W., Pan, X. Q., Chang, H., Takeuchi, I., Xiang, X.-D.
Publikováno v:
Applied Physics Letters; 5/21/2001, Vol. 78 Issue 21, p3292, 3p, 2 Diagrams, 1 Graph
Autor:
Theis, C. D., Schlom, D. G.
Publikováno v:
Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; 1996, Vol. 14 Issue 4, p2677-2679, 3p
Autor:
Bailey, GW, Jerome, WG, McKernan, S, Mansfield, JF, Price, RL, Jiang, J C, Tian, W, Theis, C D, Schlom, D G, Pan, X Q
Publikováno v:
Microscopy & Microanalysis; 1999 Supplement, p104-105, 2p